Jean-Luc Autran

22 papers C 2Journal 13Unranked 7
YearRankTypeTitle / Venue / Authors
2020 — conf
Effect of Temperature on Single Event Latchup Sensitivity.
DTIS
S. Guagliardo, Frederic Wrobel, Ygor Q. Aguiar, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul
2018 — conf
A 140 nW, 32.768 kHz, 1.9 ppm/°C Leakage-Based Digitally Relocked Clock Reference with 0.1 ppm Long-Term Stability in 28nm FD-SOI.
A-SSCC
Guenole Lallement, Fady Abouzeid, Thierry Di Gilio, Philippe Roche, Jean-Luc Autran
2018 J jnl
A 2.7 pJ/cycle 16 MHz, 0.7 µW Deep Sleep Power ARM Cortex-M0+ Core SoC in 28 nm FD-SOI.
IEEE J. Solid State Circuits
Guenole Lallement, Fady Abouzeid, Martin Cochet, Jean-Marc Daveau, Philippe Roche, Jean-Luc Autran
2018 J jnl
Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions.
Microelectron. Reliab.
Ygor Q. Aguiar, Frederic Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Antoine D. Touboul, Vincent Pouget
2018 C conf
Q-Learning-based Adaptive Power Management for IoT System-on-Chips with Embedded Power States.
ISCAS
Yvan Debizet, Guénolé Lallement, Fady Abouzeid, Philippe Roche, Jean-Luc Autran
2017 — conf
A 0.40pJ/cycle 981 μm
A-SSCC
Martin Cochet, Sylvain Clerc, Guenole Lallement, Fady Abouzeid, Philippe Roche, Jean-Luc Autran
2017 — conf
A 2.7pJ/cycle 16MHz SoC with 4.3nW power-off ARM Cortex-M0+ core in 28nm FD-SOI.
ESSCIRC
Guenole Lallement, Fady Abouzeid, Martin Cochet, Jean-Marc Daveau, Philippe Roche, Jean-Luc Autran
2017 J jnl
Multi-Poisson process analysis of real-time soft-error rate measurements in bulk 65 nm and 40 nm SRAMs.
Microelectron. Reliab.
Soilihi Moindjie, Jean-Luc Autran, Daniela Munteanu, Gilles Gasiot, Philippe Roche
2017 J jnl
Single-event-transient effects in Junctionless Double-Gate MOSFETs with Dual-Material Gate investigated by 3D simulation.
Microelectron. Reliab.
Daniela Munteanu, Jean-Luc Autran, Soilihi Moindjie
2016 C conf
A 28nm FD-SOI standard cell 0.6-1.2V open-loop frequency multiplier for low power SoC clocking.
ISCAS
Martin Cochet, Sylvain Clerc, Mehdi Naceur, Pierre Schamberger, Damien Croain, Jean-Luc Autran, Philippe Roche
2016 J jnl
Natural radiation events in CCD imagers at ground level.
Microelectron. Reliab.
Tarek Saad Saoud, Soilihi Moindjie, Daniela Munteanu, Jean-Luc Autran
2016 — conf
On-chip supply power measurement and waveform reconstruction in a 28nm FD-SOI processor SoC.
A-SSCC
Martin Cochet, Alberto Puggelli, Ben Keller, Brian Zimmer, Milovan Blagojevic, Sylvain Clerc, Philippe Roche, Jean-Luc Autran, Borivoje Nikolic
2015 J jnl
3D simulation of single-event-transient effects in symmetrical dual-material double-gate MOSFETs.
Microelectron. Reliab.
Daniela Munteanu, Jean-Luc Autran
2015 J jnl
ASTEP (2005-2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure.
Microelectron. Reliab.
Jean-Luc Autran, Daniela Munteanu, Soilihi Moindjie, Tarek Saad Saoud, S. Sauze, Gilles Gasiot, Philippe Roche
2015 — conf
Alpha soft error rate of FDSOI 28 nm SRAMs: Experimental testing and simulation analysis.
IRPS
Victor Malherbe, Gilles Gasiot, Dimitri Soussan, Aurelien Patris, Jean-Luc Autran, Philippe Roche
2015 — conf
Muons and thermal neutrons SEU characterization of 28nm UTBB FD-SOI and Bulk eSRAMs.
IRPS
Gilles Gasiot, Dimitri Soussan, Jean-Luc Autran, Victor Malherbe, Philippe Roche
2015 J jnl
Radiation and COTS at ground level.
Microelectron. Reliab.
Jean-Luc Autran, Daniela Munteanu
2015 J jnl
SEU sensitivity of Junctionless Single-Gate SOI MOSFETs-based 6T SRAM cells investigated by 3D TCAD simulation.
Microelectron. Reliab.
Daniela Munteanu, Jean-Luc Autran
2014 J jnl
Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits.
Microelectron. Reliab.
Jean-Luc Autran, Maximilien Glorieux, Daniela Munteanu, Sylvain Clerc, Gilles Gasiot, Philippe Roche
2014 J jnl
Radiation sensitivity of junctionless double-gate 6T SRAM cells investigated by 3-D numerical simulation.
Microelectron. Reliab.
Daniela Munteanu, Jean-Luc Autran
2014 J jnl
Real-time soft-error rate measurements: A review.
Microelectron. Reliab.
Jean-Luc Autran, Daniela Munteanu, Philippe Roche, Gilles Gasiot
2010 J jnl
Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level.
Microelectron. Reliab.
Jean-Luc Autran, Daniela Munteanu, Philippe Roche, Gilles Gasiot, S. Martinie, S. Uznanski, S. Sauze, S. Semikh, Evgeny Yakushev, S. Rozov, Pia Loaiza, G. Warot, M. Zampaolo