Jayashree Saxena

18 papers A 12C 1Misc 1Journal 4

Year	Rank	Type	Title / Venue / Authors
2009	J	`jnl`	Multidimensional Test Escape Rate Modeling. IEEE Des. Test Comput. Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch
2008	J	`jnl`	Low Power Test for Nanometer System-on-Chips (SoCs). J. Low Power Electron. Srivaths Ravi, Rubin A. Parekhji, Jayashree Saxena
2008	A	`conf`	Modeling Test Escape Rate as a Function of Multiple Coverages. ITC Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena
2004	A	`conf`	Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. ITC Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington
2003	A	`conf`	A Case Study of IR-Drop in Structured At-Speed Testing. ITC Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger
2002	A	`conf`	Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . ITC Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech
2001	A	`conf`	An analysis of power reduction techniques in scan testing. ITC Jayashree Saxena, Kenneth M. Butler, Lee Whetsel
2000	A	`conf`	An empirical study on the effects of test type ordering on overall test efficiency. ITC Jayashree Saxena, Kenneth M. Butler
2000	A	`conf`	Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. ITC Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler
1998	A	`conf`	IC diagnosis: preventing wars and war stories. ITC Jayashree Saxena
1998	A	`conf`	On applying non-classical defect models to automated diagnosis. ITC Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess
1997	J	`jnl`	Automated Diagnosis in Testing and Failure Analysis. IEEE Des. Test Comput. Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena
1997	A	`conf`	Bridging Fault Diagnosis in the Absence of Physical Information. ITC David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess, Jayashree Saxena, Kenneth M. Butler
1996	A	`conf`	Integrating Automated Diagnosis into the Testing and Failure Analysis Operations. ITC Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Jones, Jayashree Saxena
1995	J	`jnl`	A novel scheme to reduce test application time in circuits with full scan. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Dhiraj K. Pradhan, Jayashree Saxena
1993	A	`conf`	A Method to Derive Compact Test Sets for Path Delay Faults in Combinational Circuits. ITC Jayashree Saxena, Dhiraj K. Pradhan
1993	C	`conf`	Desgin for Testability of Asynchronous Sequential Circuits. ICCD Jayashree Saxena, Dhiraj K. Pradhan
1992	Misc	`conf`	A design for testability scheme to reduce test application time in full scan. VTS Dhiraj K. Pradhan, Jayashree Saxena