| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2019 | J | jnl |
IEEE Des. Test
|
| 2017 | J | jnl |
IEEE Des. Test
|
| 2017 | J | jnl |
IEEE Des. Test
|
| 2017 | A* | conf |
DAC
|
| 2017 | — | conf |
ASP-DAC
|
| 2017 | J | jnl |
IEEE Des. Test
|
| 2017 | A* | conf |
DAC
|
| 2016 | — | conf |
SoCC
|
| 2016 | — | conf |
SoCC
|
| 2014 | A | conf |
ICCAD
|
| 2013 | — | conf |
VLSI-DAT
|
| 2013 | A | conf |
DATE
|
| 2012 | — | conf |
ASP-DAC
|
| 2012 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2012 | A | conf |
ICCAD
|
| 2011 | — | conf |
MTV
|
| 2010 | A | conf |
ITC
|
| 2010 | Misc | conf |
VTS
|
| 2010 | — | conf |
ISQED
|
| 2009 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2009 | — | conf |
ISQED
|
| 2009 | A | conf |
ICCAD
|
| 2009 | A | conf |
ITC
|
| 2009 | — | conf |
MTV
|
| 2009 | A | conf |
ITC
|
| 2009 | — | conf |
ISVLSI
|
| 2008 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2007 | B | conf |
FMCAD
|
| 2007 | J | jnl |
IEEE Des. Test Comput.
|
| 2007 | A | conf |
ICCAD
|
| 2007 | — | ed. |
MTV
|
| 2007 | A | conf |
Enhancing signal controllability in functional test-benches through automatic constraint extraction.
ITC
|
| 2007 | J | jnl |
IEEE Des. Test Comput.
|
| 2006 | — | conf |
SoCC
|
| 2006 | — | conf |
MTV
|
| 2006 | — | ed. |
MTV
|
| 2005 | J | jnl |
Formal Methods Syst. Des.
|
| 2005 | — | conf |
MTV
|
| 2005 | — | conf |
HLDVT
|
| 2004 | J | jnl |
IEEE Des. Test Comput.
|
| 2004 | A | conf |
ITC
|
| 2004 | Misc | conf |
VLSI Design
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2003 | — | conf |
MTV
|
| 2003 | Misc | conf |
WISA
|
| 2002 | A | conf |
ITC
|
| 2002 | Misc | conf |
VTS
|
| 2002 | Misc | conf |
VTS
|
| 2001 | — | conf |
HLDVT
|
| 2001 | A | conf |
DATE
|
| 2001 | — | conf |
CHARME
|
| 2000 | — | conf |
CICC
|
| 2000 | Misc | conf |
VLSI Design
|
| 1999 | C | conf |
ICCD
|