Javier Martín-Martínez

51 papers A* 1A 3C 4Journal 17Unranked 26
YearRankTypeTitle / Venue / Authors
2023 — conf
Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability.
IRPS
Javier Martín-Martínez, Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Montserrat Nafría
2023 — conf
Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices.
SMACD
Francisco V. Fernández, Elisenda Roca, Pablo Saraza-Canflanca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López
2022 — conf
A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation.
SMACD
Pablo Saraza-Canflanca, Javier Martín-Martínez, Elisenda Roca, Rafael Castro-López, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2022 C conf
Beneficial Role of Noise in Hf-based Memristors.
ISCAS
Rosana Rodríguez, Javier Martín-Martínez, Emili Salvador Aguilera, Albert Crespo-Yepes, Enrique Miranda, Montserrat Nafría, Antonio Rubio, Vasileios G. Ntinas, Georgios Ch. Sirakoulis
2022 J jnl
On the Impact of the Biasing History on the Characterization of Random Telegraph Noise.
IEEE Trans. Instrum. Meas.
Pablo Saraza-Canflanca, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2021 J jnl
Power-Efficient Noise-Induced Reduction of ReRAM Cell's Temporal Variability Effects.
IEEE Trans. Circuits Syst. II Express Briefs
Vasileios G. Ntinas, Antonio Rubio, Georgios Ch. Sirakoulis, Emili Salvador Aguilera, Marta Pedro, Albert Crespo-Yepes, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría
2020 J jnl
A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level.
Integr.
Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2020 — conf
Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation.
IRPS
Rosana Rodríguez, Albert Crespo-Yepes, Javier Martín-Martínez, Montserrat Nafría, Xavier Aragonès, Diego Mateo, Enrique Barajas
2020 J jnl
Flexible Setup for the Measurement of CMOS Time-Dependent Variability With Array-Based Integrated Circuits.
IEEE Trans. Instrum. Meas.
Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Francisco V. Fernández, Montserrat Nafría
2019 — conf
A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices.
IRPS
G. Pedreira, Javier Martín-Martínez, Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Montserrat Nafría
2019 J jnl
A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI.
IEEE J. Solid State Circuits
Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Xavier Aragonès, Enrique Barajas, Diego Mateo, Francisco V. Fernández, Montserrat Nafría
2019 C conf
Aging in CMOS RF Linear Power Amplifiers: Experimental Comparison and Modeling.
ISCAS
Xavier Aragonès, Diego Mateo, Enrique Barajas, Albert Crespo-Yepes, Rosana Rodríguez, Javier Martín-Martínez, Montserrat Nafría
2019 — conf
An IC Array for the Statistical Characterization of Time-Dependent Variability of Basic Circuit Blocks.
SMACD
Pablo Martín-Lloret, Juan Núñez, Elisenda Roca, Rafael Castro-López, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2019 — conf
Experimental Characterization of Time-Dependent Variability in Ring Oscillators.
SMACD
Juan Núñez, Elisenda Roca, Rafael Castro-López, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2019 J jnl
Experimental Verification of Memristor-Based Material Implication NAND Operation.
IEEE Trans. Emerg. Top. Comput.
Marcos Maestro-Izquierdo, Javier Martín-Martínez, Albert Crespo-Yepes, Manel Escudero, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Antonio Rubio
2019 A conf
Generation of Lifetime-Aware Pareto-Optimal Fronts Using a Stochastic Reliability Simulator.
DATE
Antonio Toro-Frías, Pablo Saraza-Canflanca, Fábio Passos, Pablo Martín-Lloret, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2019 A conf
New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors.
DATE
Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca Moreno, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2019 — conf
Noise-induced Performance Enhancement of Variability-aware Memristor Networks.
ICECS
Vasileios G. Ntinas, Iosif-Angelos Fyrigos, Georgios Ch. Sirakoulis, Antonio Rubio, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría
2019 — conf
TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level.
SMACD
Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2018 — conf
A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation.
SMACD
Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Antonio Toro-Frías, Rafael Castro-López, Javier Martín-Martínez, Elisenda Roca, Rosana Rodríguez, Francisco V. Fernández, Montserrat Nafría
2018 — conf
Analysis of Body Bias and RTN-Induced Frequency Shift of Low Voltage Ring Oscillators in FDSOI Technology.
PATMOS
Enrique Barajas, Xavier Aragonès, Diego Mateo, Francesc Moll, Antonio Rubio, Javier Martín-Martínez, Rosana Rodríguez, Marc Porti, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández
2018 — conf
Automated Massive RTN Characterization Using a Transistor Array Chip.
SMACD
Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Antonio Toro-Frías, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2018 C conf
CMOS Characterization and Compact Modelling for Circuit Reliability Simulation.
IOLTS
Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández
2018 — conf
Design Considerations of an SRAM Array for the Statistical Validation of Time-Dependent Variability Models.
SMACD
Pablo Saraza-Canflanca, D. Malagon, Fábio Passos, A. Toro, Juan Núñez, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2018 — conf
Device variability tolerance of a RRAM-based self-organizing neuromorphic system.
IRPS
Marta Pedro, Javier Martín-Martínez, Enrique Miranda, Rosana Rodríguez, Montserrat Nafría, M. B. González, Francesca Campabadal
2018 — conf
Investigation of Conductivity Changes in Memristors under Massive Pulsed Characterization.
DCIS
Marta Pedro, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich
2018 — conf
Lifetime Calculation Using a Stochastic Reliability Simulator for Analog ICs.
SMACD
Antonio Toro-Frías, Pablo Martín-Lloret, Javier Martín-Martínez, Rafael Castro-López, Elisenda Roca, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2018 J jnl
Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV.
IEEE Trans. Circuits Syst. I Regul. Pap.
Victor M. van Santen, Javier Martín-Martínez, Hussam Amrouch, Montserrat Nafría, Jörg Henkel
2018 — conf
Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability.
IRPS
Victor M. van Santen, Javier Diaz-Fortuny, Hussam Amrouch, Javier Martín-Martínez, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Jörg Henkel, Montserrat Nafría
2017 C conf
A size-adaptive time-step algorithm for accurate simulation of aging in analog ICs.
ISCAS
Pablo Martín-Lloret, Antonio Toro-Frías, Javier Martín-Martínez, Rafael Castro-López, Elisenda Roca, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2017 — conf
A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging.
SMACD
Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Enrique Barajas, Xavier Aragonès, Diego Mateo
2017 — conf
CASE: A reliability simulation tool for analog ICs.
SMACD
Pablo Martín-Lloret, Antonio Toro-Frías, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría
2017 — conf
Including a stochastic model of aging in a reliability simulation flow.
SMACD
Antonio Toro-Frías, Pablo Martín-Lloret, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría
2017 — conf
Statistical characterization and modeling of random telegraph noise effects in 65nm SRAMs cells.
SMACD
Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Gabriel Torrens, Sebastià A. Bota, Jaume Segura, Francesc Moll, Antonio Rubio
2017 — conf
TARS: A toolbox for statistical reliability modeling of CMOS devices.
SMACD
Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández
2016 A* conf
Designing guardbands for instantaneous aging effects.
DAC
Victor M. van Santen, Hussam Amrouch, Javier Martín-Martínez, Montserrat Nafría, Jörg Henkel
2016 J jnl
Reliability simulation for analog ICs: Goals, solutions, and challenges.
Integr.
Antonio Toro-Frías, Pablo Martín-Lloret, Javier Martín-Martínez, Rafael Castro-López, Elisenda Roca, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2015 — conf
Connecting the physical and application level towards grasping aging effects.
IRPS
Hussam Amrouch, Javier Martín-Martínez, Victor M. van Santen, Miquel Moras, Rosana Rodríguez, Montserrat Nafría, Jörg Henkel
2015 — conf
Threshold voltage and on-current Variability related to interface traps spatial distribution.
ESSDERC
V. Velayudhan, Javier Martín-Martínez, Marc Porti, Carlos Couso, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Carlos Marquez, Francisco Gámiz
2014 J jnl
A shapeshifting evolvable hardware mechanism based on reconfigurable memFETs crossbar architecture.
Microelectron. Reliab.
Javier Martín-Martínez, Carmen G. Almudéver, Albert Crespo-Yepes, Rosana Rodríguez, Montserrat Nafría, Antonio Rubio
2013 J jnl
Influence of the interface trap location on the performance and variability of ultra-scaled MOSFETs.
Microelectron. Reliab.
V. Velayudhan, Francisco Gámiz, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich
2013 J jnl
Resistive switching like-behavior in MOSFETs with ultra-thin HfSiON dielectric gate stack: pMOS and nMOS comparison and reliability implications.
Microelectron. Reliab.
Albert Crespo-Yepes, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich
2012 J jnl
Characterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs.
Microelectron. Reliab.
Nuria Ayala, Javier Martín-Martínez, Rosana Rodríguez, M. B. González, Montserrat Nafría, Xavier Aymerich, Eddy Simoen
2012 — conf
Shape-shifting digital hardware concept: Towards a new adaptive computing system.
AHS
Carmen G. Almudéver, Antonio Rubio, Javier Martín-Martínez, Albert Crespo-Yepes, Rosana Rodríguez, Montserrat Nafría
2012 — conf
Unified characterization of RTN and BTI for circuit performance and variability simulation.
ESSDERC
Nuria Ayala, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich
2010 J jnl
SPICE modelling of hot-carrier degradation in Si
Microelectron. Reliab.
Javier Martín-Martínez, Esteve Amat, M. B. González, P. Verheyen, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Eddy Simoen
2009 J jnl
Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks.
Microelectron. Reliab.
Enrique Miranda, Javier Martín-Martínez, Eamon O'Connor, G. Hughes, P. Casey, Karim Cherkaoui, S. Monaghan, R. Long, D. O'Connell, Paul K. Hurley
2009 J jnl
Reversible dielectric breakdown in ultrathin Hf based high-k stacks under current-limited stresses.
Microelectron. Reliab.
Albert Crespo-Yepes, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich
2008 A conf
Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies.
DATE
Georges G. E. Gielen, Pieter De Wit, Elie Maricau, Johan Loeckx, Javier Martín-Martínez, Ben Kaczer, Guido Groeseneken, Rosana Rodríguez, Montserrat Nafría
2007 J jnl
Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs.
Microelectron. Reliab.
Javier Martín-Martínez, Simone Gerardin, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Andrea Cester, Alessandro Paccagnella, G. Ghidini
2007 J jnl
Worn-out oxide MOSFET characteristics: Role of gate current and device parameters on a current mirror.
Microelectron. Reliab.
Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, James H. Stathis