| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | — | conf |
MECO
|
| 2023 | — | conf |
MECO
|
| 2020 | C | conf |
Evaluation of the SEU Faults Coverage of a Simple Fault Model for Application-Oriented FPGA Testing.
DSD
|
| 2017 | J | jnl |
Microprocess. Microsystems
|
| 2016 | C | conf |
DSD
|
| 2016 | C | conf |
DDECS
|
| 2014 | C | conf |
DSD
|
| 2012 | C | conf |
DSD
|
| 2011 | C | conf |
DSD
|
| 2010 | C | conf |
DSD
|
| 2009 | C | conf |
DSD
|