| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | — | conf |
ICSR + AI (3)
|
| 2024 | J | jnl |
CoRR
|
| 2022 | — | conf |
SYSINT
|
| 2022 | J | jnl |
Sensors
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2016 | — | conf |
IEEE SENSORS
|
| 2016 | J | jnl |
Sensors
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2014 | — | conf |
ESSDERC
|
| 2013 | J | jnl |
Wirel. Pers. Commun.
|
| 2013 | J | jnl |
Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor.
Microelectron. Reliab.
|
| 2012 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2012 | — | conf |
Stretchable biocompatible electronics by embedding electrical circuitry in biocompatible elastomers.
EMBC
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2011 | J | jnl |
EURASIP J. Wirel. Commun. Netw.
|
| 2011 | — | conf |
EMBC
|
| 2009 | J | jnl |
Displays
|
| 2008 | J | jnl |
Microelectron. Reliab.
|
| 2008 | — | conf |
NIME
|
| 2008 | — | conf |
NIME
|
| 2003 | J | jnl |
Microelectron. Reliab.
|
| 1990 | J | jnl |
IEEE J. Solid State Circuits
|