Jan Malburg

17 papers A* 2A 1C 4Journal 3Unranked 6
YearRankTypeTitle / Venue / Authors
2019 C conf
Engineering of an Effective Automatic Dynamic Assertion Mining Platform.
VLSI-SoC
Tara Ghasempouri, Jan Malburg, Alessandro Danese, Graziano Pravadelli, Görschwin Fey, Jaan Raik
2019 C conf
Fault-Aware Performance Assessment Approach for Embedded Networks.
DDECS
Jan Malburg, Karl Janson, Jaan Raik, Frank Dannemann
2018 — conf
Mining Latency Guarantees for RTL Designs.
ISMVL
Jan Malburg, Heinz Riener, Görschwin Fey
2017 — conf
Property mining using dynamic dependency graphs.
ASP-DAC
Jan Malburg, Tino Flenker, Görschwin Fey
2017 — conf
Towards Making Fault Injection on Abstract Models a More Accurate Tool for Predicting RT-Level Effects.
ISVLSI
Tino Flenker, Jan Malburg, Görschwin Fey, Serhiy Avramenko, Massimo Violante, Matteo Sonza Reorda
2016 J jnl
Debugging hardware designs using dynamic dependency graphs.
Microprocess. Microsystems
Jan Malburg, Alexander Finder, Görschwin Fey
2016 C conf
Designing reliable cyber-physical systems overview associated to the special session at FDL'16.
FDL
Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon D. ter Braak, Sergei Devadze, Görschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkhoff, Robert Könighofer, Jan Malburg, Shiri Moran, Jaan Raik, Gerard K. Rauwerda, Heinz Riener, Franz Röck, Konstantin Shibin, Kim Sunesen, Jinbo Wan, Yong Zhao
2016 — —
Feature Localization and Design Understanding for Hardware Designs.
Jan Malburg
2014 J jnl
A Simulation-Based Approach for Automated Feature Localization.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jan Malburg, Alexander Finder, Görschwin Fey
2014 C conf
Automatically connecting hardware blocks via light-weight matching techniques.
DDECS
Jan Malburg, Niklas Krafczyk, Görschwin Fey
2014 — conf
Mutation Based Feature Localization.
MTV
Jan Malburg, Emmanuelle Encrenaz-Tiphène, Görschwin Fey
2014 J jnl
Search-based testing using constraint-based mutation.
Softw. Test. Verification Reliab.
Jan Malburg, Gordon Fraser
2013 A conf
Tuning dynamic data flow analysis to support design understanding.
DATE
Jan Malburg, Alexander Finder, Görschwin Fey
2012 — conf
Automated Feature Localization for Hardware Designs using Coverage Metrics.
MBMV
Jan Malburg, Alexander Finder, Görschwin Fey
2012 A* conf
Automated feature localization for hardware designs using coverage metrics.
DAC
Jan Malburg, Alexander Finder, Görschwin Fey
2011 A* conf
Combining search-based and constraint-based testing.
ASE
Jan Malburg, Gordon Fraser
2009 — conf
A Highly Scalable Rendering Framework for Arbitrary Display and Display-in-Display Configurations.
CGVR
Matthias Deller, Sebastian Thelen, Daniel Steffen, Peter-Scott Olech, Achim Ebert, Jan Malburg, Jörg Meyer