Jan Burchard

17 papers A 7C 2Misc 2Journal 2Unranked 3
YearRankTypeTitle / Venue / Authors
2025 A conf
Holistic Validation Pattern Generation for IEEE 1687 and Streaming Scan Networks.
ITC
Sebastian Huhn, Matthias Kampmann, Jan Burchard, Reinhard Meier, Kacper Czerniawski, Lori Schramm, Sandipan Sharma, Nikita Naresh, Wilson Pradeep, Prachi Sinha, Mayank Parasrampuria, Jonathan Gaudet, Martin Keim
2025 A conf
Persistent High-Bandwidth IJTAG Data Delivery.
ITC
Jan Burchard, Matthias Kampmann, Ayush Patel, Marta Stepniewska, Przemyslaw Szymanski, Wojciech Janiszewski, Jean-François Côté, Michal Olejarz, Olga Przybysz, Lori Schramm, Jonathan Gaudet, Martin Keim
2024 A conf
High-Bandwidth IJTAG over SSN.
ITC
Jonathan Gaudet, Jan Burchard, Matthias Kampmann, Jean-François Côté, Tim Callahan, Hung Ho Chai, Ivy Ee Hsia Lim, Lori Schramm, Olga Przybysz, Marta Stepniewska, Sascha Ochsenknecht, Michal Olejarz, Martin Keim
2019 A conf
On Secure Data Flow in Reconfigurable Scan Networks.
DATE
Pascal Raiola, Benjamin Thiemann, Jan Burchard, Ahmed Atteya, Natalia Lylina, Hans-Joachim Wunderlich, Bernd Becker, Matthias Sauer
2018 — —
Applying advanced SAT-based techniques to circuit testing.
Jan Burchard
2018 A conf
Characterization of possibly detected faults by accurately computing their detection probability.
DATE
Jan Burchard, Dominik Erb, Bernd Becker
2018 Misc conf
Efficient generation of parametric test conditions for AMS chips with an interval constraint solver.
VTS
Felix Neubauer, Jan Burchard, Pascal Raiola, Jochen Rivoir, Bernd Becker, Matthias Sauer
2018 J jnl
On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker
2017 C conf
AutoFault: Towards Automatic Construction of Algebraic Fault Attacks.
FDTC
Jan Burchard, Mael Gay, Ange-Salomé Messeng Ekossono, Jan Horácek, Bernd Becker, Tobias Schubert, Martin Kreuzer, Ilia Polian
2017 Misc conf
Efficient SAT-based generation of hazard-activated TSOF tests.
VTS
Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker
2017 J jnl
Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPG.
J. Electron. Test.
Pascal Raiola, Jan Burchard, Felix Neubauer, Dominik Erb, Bernd Becker
2017 — conf
Evaluating the effectiveness of D-chains in SAT-based ATPG.
LATS
Jan Burchard, Felix Neubauer, Pascal Raiola, Dominik Erb, Bernd Becker
2017 A conf
Fast and waveform-accurate hazard-aware SAT-based TSOF ATPG.
DATE
Jan Burchard, Dominik Erb, Adit D. Singh, Sudhakar M. Reddy, Bernd Becker
2017 — conf
Integrating Algebraic and SAT Solvers.
MACIS
Jan Horácek, Jan Burchard, Bernd Becker, Martin Kreuzer
2017 — conf
Towards mixed structural-functional models for algebraic fault attacks on ciphers.
IVSW
Jan Burchard, Ange-Salomé Messeng Ekossono, Jan Horácek, Mael Gay, Bernd Becker, Tobias Schubert, Martin Kreuzer, Ilia Polian
2016 C conf
Distributed Parallel #SAT Solving.
CLUSTER
Jan Burchard, Tobias Schubert, Bernd Becker
2015 A conf
Laissez-Faire Caching for Parallel #SAT Solving.
SAT
Jan Burchard, Tobias Schubert, Bernd Becker