Jan Belohoubek

11 papers C 7Journal 2Unranked 2
YearRankTypeTitle / Venue / Authors
2025 — conf
X-Ray Radiation Effects on SRAM-Based TRNG and PUF.
ICISSP (2)
Martin Holec, Jan Belohoubek, Pavel Rous, Tomás Pokorný, Róbert Lórencz, Frantisek Steiner
2024 J jnl
On the Influence of the Laser Illumination on the Logic Cells Current Consumption.
CoRR
Dmytro Petryk, Zoya Dyka, Milos Krstic, Jan Belohoubek, Petr Fiser, Frantisek Steiner, Tomás Blecha, Peter Langendörfer, Ievgen Kabin
2023 C ed.
26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, Tallinn, Estonia, May 3-5, 2023
DDECS
Maksim Jenihhin, Hana Kubátová, Nele Metens, Jaan Raik, Foisal Ahmed, Jan Belohoubek
2023 — conf
On the Influence of the Laser Illumination on the Logic Cells Current Consumption : First measurement results.
ICECS
Dmytro Petryk, Zoya Dyka, Milos Krstic, Jan Belohoubek, Petr Fiser, Frantisek Steiner, Tomás Blecha, Peter Langendörfer, Ievgen Kabin
2020 C conf
Standard Cell Tuning Enables Data-Independent Static Power Consumption.
DDECS
Jan Belohoubek, Petr Fiser, Jan Schmidt
2019 C conf
CMOS Illumination Discloses Processed Data.
DSD
Jan Belohoubek, Petr Fiser, Jan Schmidt
2019 C conf
Using Voters May Lead to Secret Leakage.
DDECS
Jan Belohoubek, Petr Fiser, Jan Schmidt
2018 C conf
KETCube - The Universal Prototyping IoT Platform.
DSD
Jan Belohoubek, Jirí Cengery, Jaroslav Freisleben, Petr Kaspar, Ales Hamácek
2017 J jnl
Error masking method based on the short-duration offline test.
Microprocess. Microsystems
Jan Belohoubek, Petr Fiser, Jan Schmidt
2016 C conf
Error Correction Method Based on the Short-Duration Offline Test.
DSD
Jan Belohoubek, Petr Fiser, Jan Schmidt
2015 C conf
Novel C-Element Based Error Detection and Correction Method Combining Time and Area Redundancy.
DSD
Jan Belohoubek, Petr Fiser, Jan Schmidt