James R. Moyne

46 papers A* 1B 1C 14Journal 17Unranked 10

Year	Rank	Type	Title / Venue / Authors
2025	—	`conf`	Determining Investment Opportunities and Directions for Artificial Intelligence and Machine Learning Applied to Digital Twin Technology in Semiconductor Manufacturing. CASE James R. Moyne, Xiaodong Jia, Jing Shi
2024	J	`jnl`	Digital Twin-Based Cyber-Attack Detection Framework for Cyber-Physical Manufacturing Systems. IEEE Trans Autom. Sci. Eng. Efe C. Balta, Michael Pease, James R. Moyne, Kira Barton, Dawn M. Tilbury
2024	J	`jnl`	How Lithography and Metrology Are Enabling Yield in the Next Generation of Semiconductor Patterning. Computer Mark O. Neisser, Ndubuisi G. Orji, Harry J. Levinson, Umberto Celano, James R. Moyne, Supika Mashiro, Dan Wilcox, Slava Libman
2023	J	`jnl`	A digital twin framework for prognostics and health management. Comput. Ind. Maxwell Toothman, Birgit Braun, Scott J. Bury, James R. Moyne, Dawn M. Tilbury, Yixin Ye, Kira Barton
2023	—	`conf`	An Adaptive, State-Based Framework for Fault Prediction in Rotating Equipment. CASE Maxwell Toothman, Birgit Braun, Scott J. Bury, James R. Moyne, Dawn M. Tilbury, Kira Barton
2023	J	`jnl`	Opportunities and Challenges to Integrate Artificial Intelligence Into Manufacturing Systems: Thoughts From a Panel Discussion [Opinion]. IEEE Robotics Autom. Mag. Ilya Kovalenko, Kira Barton, James R. Moyne, Dawn M. Tilbury
2023	J	`jnl`	Opportunities and Challenges to Integrate Artificial Intelligence into Manufacturing Systems: Thoughts from a Panel Discussion. CoRR Ilya Kovalenko, Kira Barton, James R. Moyne, Dawn M. Tilbury
2023	J	`jnl`	Overcoming Challenges Associated with Developing Industrial Prognostics and Health Management Solutions. Sensors Maxwell Toothman, Birgit Braun, Scott J. Bury, James R. Moyne, Dawn M. Tilbury, Yixin Ye, Kira Barton
2022	J	`jnl`	Toward an Automated Learning Control Architecture for Cyber-Physical Manufacturing Systems. IEEE Access Ilya Kovalenko, James R. Moyne, Mingjie Bi, Efe C. Balta, Wenyuan Ma, Yassine Qamsane, Xiao Zhu, Z. Morley Mao, Dawn M. Tilbury, Kira Barton
2021	J	`jnl`	A Methodology to Develop and Implement Digital Twin Solutions for Manufacturing Systems. IEEE Access Yassine Qamsane, James R. Moyne, Maxwell Toothman, Ilya Kovalenko, Efe C. Balta, John Faris, Dawn M. Tilbury, Kira Barton
2021	J	`jnl`	Merging Subject Matter Expertise and Deep Convolutional Neural Network for State-Based Online Machine-Part Interaction Classification. CoRR Hao Wang, Yassine Qamsane, James R. Moyne, Kira Barton
2021	J	`jnl`	Trend-Based Repair Quality Assessment for Industrial Rotating Equipment. IEEE Control. Syst. Lett. Maxwell Toothman, Birgit Braun, Scott J. Bury, Michael Dessauer, Kaytlin Henderson, Ray Wright, Dawn M. Tilbury, James R. Moyne, Kira Barton
2021	C	`conf`	Trend-based repair quality assessment for industrial rotating equipment. ACC Maxwell Toothman, Birgit Braun, Scott J. Bury, Michael Dessauer, Kaytlin Henderson, Ray Wright, Dawn M. Tilbury, James R. Moyne, Kira Barton
2020	J	`jnl`	A Requirements Driven Digital Twin Framework: Specification and Opportunities. IEEE Access James R. Moyne, Yassine Qamsane, Efe C. Balta, Ilya Kovalenko, John Faris, Kira Barton, Dawn M. Tilbury
2019	—	`conf`	A Unified Digital Twin Framework for Real-time Monitoring and Evaluation of Smart Manufacturing Systems. CASE Yassine Qamsane, Chien-Ying Chen, Efe C. Balta, Bin-Chou Kao, Sibin Mohan, James R. Moyne, Dawn M. Tilbury, Kira Barton
2019	C	`conf`	Dynamic Rerouting of Cyber-Physical Production Systems in Response to Disruptions Based on SDC Framework. ACC Yassine Qamsane, Efe C. Balta, James R. Moyne, Dawn M. Tilbury, Kira Barton
2019	A*	`conf`	Towards Automated Safety Vetting of PLC Code in Real-World Plants. IEEE Symposium on Security and Privacy Mu Zhang, Chien-Ying Chen, Bin-Chou Kao, Yassine Qamsane, Yuru Shao, Yikai Lin, Elaine Shi, Sibin Mohan, Kira Barton, James R. Moyne, Z. Morley Mao
2018	C	`conf`	Conflict-driven Hybrid Observer-based Anomaly Detection. ACC Zheng Wang, Farshad Harirchi, Dhananjay M. Anand, Chee Yee Tang, James R. Moyne, Dawn M. Tilbury
2017	J	`jnl`	Categorization of Anomalies in Smart Manufacturing Systems to Support the Selection of Detection Mechanisms. IEEE Robotics Autom. Lett. Felipe Lopez, Miguel Saez, Yuru Shao, Efe C. Balta, James R. Moyne, Zhuoqing Morley Mao, Kira Barton, Dawn M. Tilbury
2015	J	`jnl`	A Hierarchical Incentive Arbitration Scheme for Coordinated PEV Charging Stations. IEEE Trans. Smart Grid Dhananjay M. Anand, Rupert Tull de Salis, Yijie Cheng, James R. Moyne, Dawn M. Tilbury
2015	—	`ch.`	Run-to-Run Control in Semiconductor Manufacturing. Encyclopedia of Systems and Control James R. Moyne
2014	—	`conf`	The Factory Integration Roadmap in Semiconductor manufacturing. ESSDERC James R. Moyne, Martin Schellenberger, Lothar Pfitzner
2012	—	`conf`	An IEEE 1588 performance testing dashboard for power industry requirements. PerMIS Julien Amelot, Jeffrey G. Fletcher, Ya-Shian Li-Baboud, Dhananjay M. Anand, Clement Vasseur, James R. Moyne
2010	—	`conf`	A practical implementation of distributed system control over an asynchronous Ethernet network using time stamped data. CASE Dhananjay M. Anand, Jeffrey G. Fletcher, Ya-Shian Li-Baboud, James R. Moyne
2009	—	`ch.`	Networked Control Systems for Manufacturing: Parameterization, Differentiation, Evaluation and Application. Networked Embedded Systems James R. Moyne, Dawn M. Tilbury
2009	—	`conf`	Performance evaluation of wireless networks for factory automation applications. CASE Dhananjay M. Anand, James R. Moyne, Dawn M. Tilbury
2008	—	`conf`	A Factory Health Monitor: System identification, process monitoring, and control. CASE Kyle Schroeder, James R. Moyne, Dawn M. Tilbury
2008	C	`conf`	Factory-level control consolidation using Event-Condition-Action: Case study on the reconfigurable factory testbed. ACC Lindsay V. Allen, Jing Zhang, James R. Moyne, Dawn M. Tilbury
2008	—	`conf`	Verification of ECA rule based management and control systems. CASE Jing Zhang, James R. Moyne, Dawn M. Tilbury
2007	J	`jnl`	The Emergence of Industrial Control Networks for Manufacturing Control, Diagnostics, and Safety Data. Proc. IEEE James R. Moyne, Dawn M. Tilbury
2006	C	`conf`	Dedicated vs. Shared Networks for Safety and Controls: An analysis of the trade-offs involved. ETFA Bradley Triden, Siddharth Mantri, Kyle Schroeder, Aditya Thomas, James R. Moyne, Dawn M. Tilbury
2006	C	`conf`	Experimental Determination of Real Time Peer to Peer Communication Characteristics of EtherNet/IP. ETFA Naveen Kalappa, Kristen Acton, Marco Antolovic, Siddharth Mantri, Jonathan Parrott, Jonathan E. Luntz, James R. Moyne, Dawn M. Tilbury
2006	C	`conf`	Experimental determination of network quality of service in Ethernet: UDP, OPC, and VPN. ACC Jonathan Parrott, James R. Moyne, Dawn M. Tilbury
2006	J	`jnl`	Network architecture and communication modules for guaranteeing acceptable control and communication performance for networked multi-agent systems. IEEE Trans. Ind. Informatics Feng-Li Lian, John K. Yook, Dawn M. Tilbury, James R. Moyne
2006	C	`conf`	PLC Communication using PROFINET: Experimental Results and Analysis. ETFA Marco Antolovic, Kristen Acton, Naveen Kalappa, Siddharth Mantri, Jonathan Parrott, Jonathan E. Luntz, James R. Moyne, Dawn M. Tilbury
2005	—	`ch.`	Network Protocols for Networked Control Systems. Handbook of Networked and Embedded Control Systems Feng-Li Lian, James R. Moyne, Dawn M. Tilbury
2005	C	`conf`	On-line control reconfiguration at the machine and cell levels: case studies from the reconfigurable factory testbed. ETFA Jonathan E. Luntz, James R. Moyne, Dawn M. Tilbury
2003	C	`conf`	Design of sampling and transmission rates for achieving control and communication performance in networked agent systems. ACC Feng-Li Lian, John K. Yook, Paul G. Otanez, Dawn M. Tilbury, James R. Moyne
2002	C	`conf`	Optimal controller design and evaluation for a class of networked control systems with distributed constant delays. ACC Feng-Li Lian, James R. Moyne, Dawn M. Tilbury
2002	C	`conf`	Using deadbands to reduce communication in networked control systems. ACC Paul G. Otanez, James R. Moyne, Dawn M. Tilbury
2001	C	`conf`	Analysis and modeling of networked control systems: MIMO case with multiple time delays. ACC Feng-Li Lian, James R. Moyne, Dawn M. Tilbury
2000	C	`conf`	Control performance study of a networked machining cell. ACC Feng-Li Lian, James R. Moyne, Dawn M. Tilbury
1999	J	`jnl`	An Extended Database Design Methodology for Uncertain Data Management. Inf. Sci. Nauman A. Chaudhry, James R. Moyne, Elke A. Rundensteiner
1998	—	`conf`	A Formal Model for Rule Inheritance and Overriding in Active Object-Oriented Databases. IADT Nauman A. Chaudhry, James R. Moyne, Elke A. Rundensteiner
1994	B	`conf`	A Design Methodology for Databases with Uncertain Data. SSDBM Nauman A. Chaudhry, James R. Moyne, Elke A. Rundensteiner
1991	J	`jnl`	Time sequence ordering extensions to the Entity-Relationship model and their application to the automated manufacturing process. Data Knowl. Eng. James R. Moyne, Toby J. Teorey, Leo C. McAfee Jr.