| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
Environ. Model. Softw.
|
| 2023 | J | jnl |
CoRR
|
| 2016 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2013 | J | jnl |
Technometrics
|
| 2006 | — | conf |
ICCSA (3)
|
| 2003 | J | jnl |
Int. J. Artif. Intell. Tools
|
| 2003 | J | jnl |
Int. J. Pattern Recognit. Artif. Intell.
|
| 2002 | — | conf |
SVM
|
| 2001 | J | jnl |
Inf. Sci.
|
| 2001 | J | jnl |
SIGKDD Explor.
|
| 2000 | B | conf |
ICTAI
|
| 1999 | J | jnl |
Int. J. Artif. Intell. Tools
|
| 1995 | C | conf |
SEKE
|
| 1990 | J | jnl |
IEEE Trans. Pattern Anal. Mach. Intell.
|
| 1988 | B | conf |
ICPR
|