James F. Plusquellic

18 papers A 6Misc 1Journal 4Unranked 7
YearRankTypeTitle / Venue / Authors
2017 — conf
Physical unclonable functions and dynamic partial reconfiguration for security in resource-constrained embedded systems.
HOST
Goutham Pocklassery, Venkata K. Kajuruli, James F. Plusquellic, Fareena Saqib
2015 — conf
GDS-II Trojan detection using multiple supply pad VDD and GND IDDQs in ASIC functional units.
HOST
Ian Wilcox, Fareena Saqib, James F. Plusquellic
2014 J jnl
ASIC implementation of a hardware-embedded physical unclonable function.
IET Comput. Digit. Tech.
Fareena Saqib, Matthew Areno, Jim Aarestad, James F. Plusquellic
2013 — conf
Secure mobile authentication and device association with enhanced cryptographic engines.
PRISMS
Matthew Areno, James F. Plusquellic
2010 J jnl
A Sensitivity Analysis of Power Signal Methods for Detecting Hardware Trojans Under Real Process and Environmental Conditions.
IEEE Trans. Very Large Scale Integr. Syst.
Reza M. Rad, James F. Plusquellic, Mohammad Tehranipoor
2008 — conf
Hardware Trojan Detection and Isolation Using Current Integration and Localized Current Analysis.
DFT
Xiaoxiao Wang, Hassan Salmani, Mohammad Tehranipoor, James F. Plusquellic
2005 J jnl
A Comparitive Study of W-cdma Cell Search Designs.
J. Circuits Syst. Comput.
Sanat Kamal Bahl, James F. Plusquellic, Joseph Thomas
2003 — conf
Comparison of Branching CORDIC Implementations.
ASAP
Abhishek Singh, Dhananjay S. Phatak, Tom Goff, Mike Riggs, James F. Plusquellic, Chintan Patel
2003 J jnl
Power supply transient signal analysis for defect-oriented test.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
James F. Plusquellic, Abhishek Singh, Chintan Patel, Anne E. Gattiker
2001 A conf
Detecting delay faults using power supply transient signal analysis.
ITC
Abhishek Singh, Chintan Patel, Shirong Liao, James F. Plusquellic, Anne E. Gattiker
2001 A conf
Power supply transient signal integration circuit.
ITC
Chintan Patel, Fidel Muradali, James F. Plusquellic
2000 Misc conf
Detection of CMOS Defects under Variable Processing Conditions.
VTS
Amy Germida, James F. Plusquellic
2000 A conf
Predicting device performance from pass/fail transient signal analysis data.
ITC
James F. Plusquellic, Amy Germida, Jonathan Hudson, Ernesto Staroswiecki, Chintan Patel
1999 — conf
8-Bit Multiplier Simulation Experiments Investigating the Use of Power Supply Transient Signals for the Detection of CMOS Defects.
DFT
James F. Plusquellic, Amy Germida, Zheng Yan
1999 A conf
Defect detection using power supply transient signal analysis.
ITC
Amy Germida, Zheng Yan, James F. Plusquellic, Fidel Muradali
1998 — conf
Characterization of CMOS Defects using Transient Signal Analysis.
DFT
James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan
1997 A conf
Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data.
ITC
James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan
1996 A conf
Digital Integrated Circuit Testing using Transient Signal Analysis.
ITC
James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan