Jakey Blue

15 papers C 1Misc 3Journal 8Unranked 3
YearRankTypeTitle / Venue / Authors
2021 J jnl
Equipment deterioration modeling and cause diagnosis in semiconductor manufacturing.
Int. J. Intell. Syst.
Hamideh Rostami, Jakey Blue, Argon Chen, Claude Yugma
2020 J jnl
A Structure Data-Driven Framework for Virtual Metrology Modeling.
IEEE Trans Autom. Sci. Eng.
Wei-Ting Yang, Jakey Blue, Agnès Roussy, Jacques Pinaton, Marco S. Reis
2020 J jnl
A physics-informed Run-to-Run control framework for semiconductor manufacturing.
Expert Syst. Appl.
Wei-Ting Yang, Jakey Blue, Agnès Roussy, Jacques Pinaton, Marco S. Reis
2018 J jnl
Automatic equipment fault fingerprint extraction for the fault diagnostic on the batch process data.
Appl. Soft Comput.
Hamideh Rostami, Jakey Blue, Claude Yugma
2018 — conf
Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing.
CASE
Hamideh Rostami, Jakey Blue, Argon Chen, Claude Yugma
2018 J jnl
Impact of integrating equipment health in production scheduling for semiconductor fabrication.
Comput. Ind. Eng.
Yu-Ting Kao, Stéphane Dauzère-Pérès, Jakey Blue, Shi-Chung Chang
2018 Misc conf
The Detection and the control of Machine/Chamber Mismatching in Semiconductormanufacturing.
WSC
Aabir Chouichi, Jakey Blue, Claude Yugma, François Pasqualini
2018 Misc conf
Virtual Metrology Modeling based on Gaussian Bayesian Network.
WSC
Wei-Ting Yang, Jakey Blue, Agnès Roussy, Marco S. Reis, Jacques Pinaton
2017 J jnl
Translation-Invariant Multiscale Energy-Based PCA for Monitoring Batch Processes in Semiconductor Manufacturing.
IEEE Trans Autom. Sci. Eng.
Tiago J. Rato, Jakey Blue, Jacques Pinaton, Marco S. Reis
2016 C conf
Equipment Condition Diagnosis and Fault Fingerprint Extraction in Semiconductor Manufacturing.
ICMLA
Hamideh Rostami, Jakey Blue, Claude Yugma
2016 Misc conf
Run-to-Run sensor variation monitoring for process fault diagnosis in semiconductor manufacturing.
WSC
Jakey Blue, Agnès Roussy, Jacques Pinaton
2015 J jnl
Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook.
J. Sched.
Claude Yugma, Jakey Blue, Stéphane Dauzère-Pérès, Ali Obeid
2014 — conf
Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook.
CASE
Claude Yugma, Jakey Blue, Stéphane Dauzère-Pérès, Philippe Vialletelle
2011 J jnl
Spatial Variance Spectrum Analysis and Its Application to Unsupervised Detection of Systematic Wafer Spatial Variations.
IEEE Trans Autom. Sci. Eng.
Jakey Blue, Argon Chen
2009 — conf
Optimum sampling for track PEB CD Integrated Metrology.
CASE
Argon Chen, Sean Hsueh, Jakey Blue