| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2022 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2022 | J | jnl |
Expert Syst. Appl.
|
| 2021 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2021 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2021 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2020 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2018 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | — | conf |
ICTC
|
| 2018 | — | conf |
ICIOT
|
| 2017 | — | conf |
ICTC
|
| 2015 | J | jnl |
Adv. Model. Simul. Eng. Sci.
|
| 2012 | — | conf |
EuroHaptics (2)
|
| 2012 | J | jnl |
IEEE Trans. Circuits Syst. Video Technol.
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2011 | — | conf |
EUSIPCO
|