Jaehyuk Lim

12 papers Journal 11Unranked 1
YearRankTypeTitle / Venue / Authors
2025 J jnl
Device Design Guidelines to Boost Up AC Performance of CFET (Complementary Field-Effect-Transistor)-Based Inverter.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jaehyuk Lim, Donghwan Han, Juho Sung, Seokchan Yoon, Sanghyun Kang, Gwon Kim, Hyoung Won Baac, Changhwan Shin
2025 J jnl
Remote Labor Index: Measuring AI Automation of Remote Work.
CoRR
Mantas Mazeika, Alice Gatti, Cristina Menghini, Udari Madhushani Sehwag, Shivam Singhal, Yury Orlovskiy, Steven Basart, Manasi Sharma, Denis Peskoff, Elaine Lau, Jaehyuk Lim, Lachlan Carroll, Alice Blair, Vinaya Sivakumar, Sumana Basu, Brad Kenstler, Yuntao Ma, Julian Michael, Xiaoke Li, Oliver Ingebretsen, Aditya Mehta, Jean Mottola, John Teichmann, Kevin Yu, Zaina Shaik, Adam Khoja, Richard Ren, Jason Hausenloy, Long Phan, Ye Htet, Ankit Aich, Tahseen Rabbani, Vivswan Shah, Andriy Novykov, Felix Binder, Kirill Chugunov, Luis Ramirez, Matias Geralnik, Hernán Mesura, Dean Lee, Ed-Yeremai Hernandez-Cardona, Annette Diamond, Summer Yue, Alexandr Wang, Bing Liu, Ernesto Hernandez, Dan Hendrycks
2025 J jnl
Robust Anti-Jamming Method for Large-Array Radar Systems Using Deep Learning Based Null-Space Beamforming.
IEEE Access
Jaehyuk Lim, Hogeun Yoo, Euihyuk Lee, Sunjin Oh, Jaehoon Lee
2025 J jnl
Study of 3-D Line Edge Roughness (LER) in Vertical Channel Array Transistor for DRAM.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jaehyuk Lim, Seokchan Yoon, Juho Sung, Sanghyun Kang, Gwon Kim, Hyoung Won Baac, Changhwan Shin
2025 J jnl
Utility Engineering: Analyzing and Controlling Emergent Value Systems in AIs.
CoRR
Mantas Mazeika, Xuwang Yin, Rishub Tamirisa, Jaehyuk Lim, Bruce W. Lee, Richard Ren, Long Phan, Norman Mu, Adam Khoja, Oliver Zhang, Dan Hendrycks
2024 — conf
Language Models Don't Learn the Physical Manifestation of Language.
ACL (1)
Bruce W. Lee, Jaehyuk Lim
2024 J jnl
Measuring Visual Sycophancy in Multimodal Models.
CoRR
Jaehyuk Lim, Bruce W. Lee
2024 J jnl
Tasks That Language Models Don't Learn.
CoRR
Bruce W. Lee, Jaehyuk Lim
2022 J jnl
GAN-Based Framework for Unified Estimation of Process-Induced Random Variation in FinFET.
IEEE Access
Taeeon Park, Jihwan Kwak, Hongjoon Ahn, Jinwoong Lee, Jaehyuk Lim, Sangho Yu, Changhwan Shin, Taesup Moon
2021 J jnl
Probabilistic Artificial Neural Network for Line-Edge-Roughness-Induced Random Variation in FinFET.
IEEE Access
Jaehyuk Lim, Jinwoong Lee, Changhwan Shin
2020 J jnl
Machine Learning (ML)-Based Model to Characterize the Line Edge Roughness (LER)-Induced Random Variation in FinFET.
IEEE Access
Jaehyuk Lim, Changhwan Shin
2019 J jnl
A Novel Method Using a Rectangular Groove to Reduce Far-End Crosstalk in Microstrip Lines Covered With a Dielectric Layer.
IEEE Access
Jaehyuk Lim, Seungjin Lee, Youngjin Jeong, Jaehoon Lee