Jae Wook Lee

16 papers B 2C 1Misc 1Journal 6Unranked 5
YearRankTypeTitle / Venue / Authors
2026 J jnl
Rapid prediction of dross formation and surface roughness using a stochastic CA model in L-PBF.
Eng. Comput.
Seung Yeop Lee, Kun Woo Kim, Da Hye Kim, Jae Woo Jung, Dae Cheol Ko, Jae Wook Lee
2025 J jnl
A Nondestructive Method for Measuring the Complex Permittivity of Thick Slab Specimen Using the Improved Open Waveguide Method Based on the NRW Method.
IEEE Trans. Instrum. Meas.
Kitae Park, Jung-Hwan Lim, Han-Hee Lee, Chang-Hee Hyoung, Jung-Hwan Hwang, Jong-Hwa Kwon, Jae Wook Lee
2025 J jnl
Complex Permittivity Measurements of Film-Type Materials: Effect of the Waveguide Flange.
IEEE Access
Han-Hee Lee, Sang Wook Yoon, Jae Wook Lee
2024 C conf
Bistatic SAR Raw Data Acquisition and Imaging with GPS Time-Synchronized Dual ECHO-SAR Systems.
IGARSS
Ji-Hwan Hwang, Jung-Hwan Song, Kwang Ho Choi, Hansol Choi, Bo Ra Kim, Chul H. Jung, Seong Joo Maeng, Jae Wook Lee
2023 J jnl
Iterative machine learning-based chemical similarity search to identify novel chemical inhibitors.
J. Cheminformatics
Prasannavenkatesh Durai, Sue Jung Lee, Jae Wook Lee, Cheol-Ho Pan, Keunwan Park
2015 J jnl
An Analytical Approach to Thermal Design and Optimization With a Temperature-Dependent Power Model.
IEEE Trans. Circuits Syst. I Regul. Pap.
Seongbo Shim, Jae Wook Lee, Youngsoo Shin
2012 B conf
Indirect method for random jitter measurement on SoCs using critical path characterization.
ETS
Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham
2012 Misc conf
Test of phase interpolators in high speed I/Os using a sliding window search.
VTS
Ji Hwan (Paul) Chun, Siew Mooi Lim, Shao Chee Ong, Jae Wook Lee, Jacob A. Abraham
2011 J jnl
Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip.
J. Electron. Test.
Kihyuk Han, Joonsung Park, Jae Wook Lee, Jaeyong Chung, Eonjo Byun, Cheol-Jong Woo, Sejang Oh, Jacob A. Abraham
2010 — conf
A delay measurement method using a shrinking clock signal.
ACM Great Lakes Symposium on VLSI
Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham
2010 — conf
A novel characterization technique for high speed I/O mixed signal circuit components using random jitter injection.
ASP-DAC
Ji Hwan (Paul) Chun, Jae Wook Lee, Jacob A. Abraham
2010 — conf
At-speed Test of High-Speed DUT Using Built-Off Test Interface.
Asian Test Symposium
Joonsung Park, Jae Wook Lee, Jaeyong Chung, Kihyuk Han, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh
2009 — conf
A Random Jitter RMS Estimation Technique for BIST Applications.
Asian Test Symposium
Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham
2009 — —
GSF for guaranteed QoS in shared memory systems.
Jae Wook Lee
2009 B conf
Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip.
ETS
Kihyuk Han, Joonsung Park, Jae Wook Lee, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh
2004 — conf
Lightweight Specification-based Testing of Memory Cards: A Case Study.
MBT
Seung Mo Cho, Jae Wook Lee