Jae-Seong Jeong

14 papers Journal 13Unranked 1
YearRankTypeTitle / Venue / Authors
2017 J jnl
Lifetime and failure analysis of perovskite-based ceramic NTC thermistors by thermal cycling and abrasion combined stress.
Microelectron. Reliab.
Jae-Seong Jeong, Won-kyoung Lee, Chung-kuk Lee, Joongho Choi
2016 J jnl
Effect of H/Ar treatment on ZnO: B transparent conducting oxide for flexible a-Si: H/μc-Si: H photovoltaic modules under damp heat stress.
Microelectron. Reliab.
Jae-Seong Jeong, Yong-Hyun Kim, Chang-kyun Park, Heon-Do Kim, Joongho Choi
2015 J jnl
The degradation mechanism of flexible a-Si: H/μc-Si: H photovoltaic modules.
Microelectron. Reliab.
Jae-Seong Jeong, Yong-Hyun Kim, Chang-kyun Park, Heon-Do Kim, Joongho Choi
2014 J jnl
Estimation of the degradation rate of multi-crystalline silicon photovoltaic module under thermal cycling stress.
Microelectron. Reliab.
Nochang Park, Jae-Seong Jeong, Changwoon Han
2013 J jnl
Field failure mechanism and reproduction due to moisture for low-voltage ZnO varistors.
Microelectron. Reliab.
Jae-Seong Jeong
2012 J jnl
Failure mechanism and reliability test method for USB interface circuitry on CPUs for mobile devices.
Microelectron. Reliab.
Jae-Seong Jeong
2012 J jnl
Field failure mechanism study of solder interconnection for crystalline silicon photovoltaic module.
Microelectron. Reliab.
Jae-Seong Jeong, Nochang Park, Changwoon Han
2010 — conf
An Efficient Method for Game Development using Compiler.
ICEIS (3)
Jae-Seong Jeong, Soon Ghon Kim
2010 J jnl
Failure mechanism of COF based Line Driver IC for Flat Panel Display by contamination.
Microelectron. Reliab.
Jae-Seong Jeong, Young Jeon Kim
2009 J jnl
Failure analysis of video processor defined as No Fault Found (NFF): Reproduction in system level and advanced analysis technique in IC level.
Microelectron. Reliab.
Jae-Seong Jeong, Sang-Deuk Park
2008 J jnl
Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED.
Microelectron. Reliab.
Jae-Seong Jeong, Jin-Kyu Jung, Sang-Deuk Park
2007 J jnl
Field failure mechanism and improvement of EOS failure of integrated IGBT inverter modules.
Microelectron. Reliab.
Jae-Seong Jeong, Soon-Ha Hong, Sang-Deuk Park
2005 J jnl
Stress Mechanism about Field Lightning Surge of High Voltage BJT Based Line Driver for ADSL System.
Microelectron. Reliab.
Jae-Seong Jeong, Jae-Hyun Lee, Jong-Shin Ha, Sang-Deuk Park
2004 J jnl
Field Failure Mechanism Investigation of GaAs based HBT Power Amplifier Mmodule (PAM).
Microelectron. Reliab.
Jae-Seong Jeong, Jong-Shin Ha, Sang-Deuk Park