| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2023 | J | jnl |
Insulation Resistance and Tracking Index of Circuit Breaker According to the Accelerated Aging Test.
IEEE Access
|
| 2022 | — | conf |
VLSI Technology and Circuits
|
| 2022 | — | conf |
ISSCC
|
| 2022 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
J. Inf. Process. Syst.
|
| 2020 | — | conf |
ICTC
|
| 2019 | — | conf |
ICUFN
|
| 2018 | J | jnl |
Int. J. Inf. Technol. Manag.
|
| 2017 | — | conf |
EMBC
|
| 2016 | — | conf |
ICTC
|
| 2010 | — | conf |
ICTC
|
| 2007 | — | conf |
World Congress on Engineering
|
| 2007 | J | jnl |
Inf. Process. Manag.
|
| 2007 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2005 | — | conf |
NTCIR
|
| 2003 | — | conf |
IRAL
|
| 2003 | Misc | conf |
IC-AI
|
| 2002 | B | conf |
PRICAI
|
| 2002 | B | conf |
COLING
|
| 2002 | — | conf |
IMSA
|
| 2000 | — | conf |
TREC
|
| 1995 | A | conf |
ICDAR
|
| 1994 | A | conf |
ITC
|