Jacques Pinaton

50 papers A 1C 4Misc 11Journal 4Unranked 30
YearRankTypeTitle / Venue / Authors
2022 — conf
LASSO-based Health Indicator Extraction Method for Semiconductor Manufacturing Processes.
ECC
Dima El Jamal, Bouchra Ananou, Guillaume Graton, Mustapha Ouladsine, Jacques Pinaton
2021 — conf
Combining Approaches of Brownian Motion and Similarity Principle to Improve the Remaining Useful Life Prediction.
ICPHM
Dima El Jamal, Mohammed Al-Kharaz, Bouchra Ananou, Guillaume Graton, Mustapha Ouladsine, Jacques Pinaton
2021 — conf
Data-Based Approach for Final Product Quality Inspection: Application to a Semiconductor Industry.
CDC
Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton
2021 — conf
From Alarm System Events Towards Quality Inspection of The Final Product: Application to a Semiconductor Industry.
ECC
Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton
2021 A conf
Similarity-based Brownian Motion Approach for Remaining Useful Life Prediction.
ICCAD
Dima El Jamal, Bouchra Ananou, Guillaume Graton, Mustapha Ouladsine, Jacques Pinaton
2020 J jnl
A Structure Data-Driven Framework for Virtual Metrology Modeling.
IEEE Trans Autom. Sci. Eng.
Wei-Ting Yang, Jakey Blue, Agnès Roussy, Jacques Pinaton, Marco S. Reis
2020 J jnl
A physics-informed Run-to-Run control framework for semiconductor manufacturing.
Expert Syst. Appl.
Wei-Ting Yang, Jakey Blue, Agnès Roussy, Jacques Pinaton, Marco S. Reis
2019 C conf
Evaluation of Alarm System Performance and Management in Semiconductor Manufacturing.
CoDIT
Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton
2019 — conf
Indicator of Alarm Risk on Product Degradation, Prediction for Alarms Grouping, Using Alarms Data in Semiconductor Manufacturing.
CDC
Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton
2019 — conf
Limiting state space explosion of model checking using discrete event simulation: combining DEVS and PROMELA.
SummerSim
Abdelhak Khemiri, Maâmar El-Amine Hamri, Claudia S. Frydman, Jacques Pinaton
2019 — conf
Monitoring of a sampled process data under Run-to-Run control: application to a semiconductor process.
CASE
Taki Eddine Korabi, Guillaume Graton, El Mostafa El Adel, Mustapha Ouladsine, Jacques Pinaton
2019 — conf
Quality Prediction in Semiconductor Manufacturing processes Using Multilayer Perceptron Feedforward Artificial Neural Network
ICSC
Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton
2018 Misc conf
A Bayesian indicator for Run-to-Run Performance Assessment using Industrail Risk.
WSC
Taki Eddine Korabi, Guillaume Graton, El Mostafa El Adel, Mustapha Ouladsine, Jacques Pinaton
2018 — conf
A Bayesian indicator for Run-to-Run performance assessment in semiconductor manufacturing.
PRIME
Taki Eddine Korabi, Guillaume Graton, El Mostafa El Adel, Mustapha Ouladsine, Jacques Pinaton
2018 Misc conf
A Study on the Integration of Complex Machines in Complex Job shop Scheduling.
WSC
Karim Tamssaouet, Stéphane Dauzère-Pérès, Claude Yugma, Sebastian Knopp, Jacques Pinaton
2018 Misc conf
Improving Business Process in semiconductor manufacturing by Discovering Business Rules.
WSC
Abdelhak Khemiri, Maâmar El-Amine Hamri, Claudia S. Frydman, Jacques Pinaton
2018 Misc conf
Virtual Metrology Modeling based on Gaussian Bayesian Network.
WSC
Wei-Ting Yang, Jakey Blue, Agnès Roussy, Marco S. Reis, Jacques Pinaton
2017 Misc conf
A Simulation-Based Approach for an Effective AMHS Design in a Legacy Semiconductor Manufacturing Facility.
WSC
Ali Ben-Salem, Claude Yugma, Emmanuel Troncet, Jacques Pinaton
2017 — conf
Analysis of similarities between alarm events in the semiconductor manufacturing process.
MED
Mariam Melhem, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton
2017 — conf
Product quality prediction using alarm data : Application to the semiconductor manufacturing process.
MED
Mariam Melhem, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton
2017 J jnl
Translation-Invariant Multiscale Energy-Based PCA for Monitoring Batch Processes in Semiconductor Manufacturing.
IEEE Trans Autom. Sci. Eng.
Tiago J. Rato, Jakey Blue, Jacques Pinaton, Marco S. Reis
2016 C conf
Gaussian Time Error: A new index for fault detection in semiconductor processes.
ACC
Julien Marino, Francesco Rossi, Mustapha Ouladsine, Jacques Pinaton
2016 — conf
Online optimized parameters for RLS-LT controller - application to processes with mixed products and feature aging.
ICSC
Guillaume Graton, El Mostafa El Adel, Mustapha Ouladsine, Jacques Pinaton
2016 — conf
Regularized regression models to predict the product quality in multistep manufacturing.
ICSC
Mariam Melhem, Bouchra Ananou, Mustapha Ouladsine, Jacques Pinaton
2016 — conf
Run To Run control based on categorical output in semiconductor manufacturing.
ICSC
El Mostafa El Adel, Guillaume Graton, Mustapha Ouladsine, Jacques Pinaton
2016 Misc conf
Run-to-Run sensor variation monitoring for process fault diagnosis in semiconductor manufacturing.
WSC
Jakey Blue, Agnès Roussy, Jacques Pinaton
2016 — conf
Self-tuning of dEWMA controller parameters for mixed product processes with equipment aging.
MED
Guillaume Graton, El Mostafa El Adel, Mustapha Ouladsine, Jacques Pinaton
2016 — conf
Virtual metrology on Chemical Mechanical Planarization process based on Just-In-Time Learning.
ICSC
Mohamed Ali Jebri, Guillaume Graton, El Mostafa El Adel, Mustapha Ouladsine, Jacques Pinaton
2015 — conf
Defect diagnosis using in line product control data in semiconductor industry.
ICSC
Mohamad Chakaroun, Mohand Djeziri, Mustapha Ouladsine, Jacques Pinaton
2015 — conf
Degradation modelling with operating mode changes.
ICPHM
Thi-Bich-Lien Nguyen, Mohand Djeziri, Bouchra Ananou, Mustapha Ouladsine, Jacques Pinaton
2015 J jnl
Optimized allocation of defect inspection capacity with a dynamic sampling strategy.
Comput. Oper. Res.
Gloria Luz Rodríguez-Verján, Stéphane Dauzère-Pérès, Jacques Pinaton
2015 Misc conf
Simulation model to control risk levels on process equipment through metrology in semiconductor manufacturing.
WSC
Alejandro Sendón, Stéphane Dauzère-Pérès, Jacques Pinaton
2014 — conf
A Pattern-based Approach for Semantic Retrieval of Information Resources in Enterprises - Application Within STMicroelectronics.
ICEIS (1)
Sara Bouzid, Corine Cauvet, Claudia S. Frydman, Jacques Pinaton
2014 — conf
Similar sample selection approach based on sequence alignment; application to semiconductor industry.
MED
Mohamad Chakaroun, Mohand Djeziri, Mustapha Ouladsine, Jacques Pinaton
2014 — conf
Smart dynamic sampling for wafer at risk reduction in semiconductor manufacturing.
CASE
Sylvain Housseman, Stéphane Dauzère-Pérès, Gloria Rodríguez-Verján, Jacques Pinaton
2013 — conf
A Semantic Mapping Approach to Retrieve Manufacturing Information Resources: STMicroelectronics' Case Study.
MIM
Sara Bouzid, Corine Cauvet, Claudia S. Frydman, Jacques Pinaton
2013 C conf
A semantic support to improve the collaborative control of manufacturing processes in industries.
CSCWD
Sara Bouzid, Corine Cauvet, Claudia S. Frydman, Jacques Pinaton
2013 — conf
Application of Principal Components Analysis to improve fault detection and diagnosis on semiconductor manufacturing equipment.
ECC
Alexis Thieullen, Mustapha Ouladsine, Jacques Pinaton
2013 Misc conf
Skipping algorithms for defect inspection using a dynamic control strategy in semiconductor manufacturing.
WSC
Gloria Luz Rodríguez-Verján, Stéphane Dauzère-Pérès, Sylvain Housseman, Jacques Pinaton
2012 — conf
A Topic-Map-based Framework to Enhance Components' Retrieval in a Process Control.
ICEIS (2)
Sara Bouzid, Corine Cauvet, Jacques Pinaton
2012 Misc conf
A mathematical model for estimating defect inspection capacity with a dynamic control strategy.
WSC
Gloria Rodríguez-Verján, Stéphane Dauzère-Pérès, Jacques Pinaton
2012 — conf
A survey of semantic web standards to representing knowledge in problem solving situations.
CAMP
Sara Bouzid, Corine Cauvet, Jacques Pinaton
2012 — conf
Dispatching of lots to dynamically reduce the wafers at risk in semiconductor manufacturing.
CASE
Gloria Rodríguez-Verján, Eric Tartiere, Jacques Pinaton, Stéphane Dauzère-Pérès, Alexis Thieullen
2012 — conf
Validating manufacturing processes using timed sequential machines: application to a semiconductor manufacturing process (WIP).
SpringSim (TMS-DEVS)
Pamela Viale, Norbert Giambiasi, Claudia S. Frydman, Jacques Pinaton
2011 Misc conf
A smart sampling scheduling and skipping simulator and its evaluation on real data sets.
WSC
Claude Yugma, Stéphane Dauzère-Pérès, Jean-Loup Rouveyrol, Philippe Vialletelle, Jacques Pinaton, Christophe Relliaud
2011 — conf
Constructing DEVS models based on experts' knowledge: application to STMicroelectronics' large scale manufacturing processes.
SpringSim (TMS-DEVS)
Pamela Viale, Claudia S. Frydman, Jacques Pinaton
2011 Misc conf
Impact of control plan design on tool risk management: a simulation study in semiconductor manufacturing.
WSC
Gloria Rodríguez-Verján, Stéphane Dauzère-Pérès, Jacques Pinaton
2011 C conf
New methodology for modeling large scale manufacturing process: Using process mining methods and experts' knowledge.
AICCSA
Pamela Viale, Claudia S. Frydman, Jacques Pinaton
2010 — conf
Discovering Large Scale Manufacturing Process Models from Timed Data - Application to STMicroelectronics' Production Processes.
ICSOFT (1)
Pamela Viale, Nabil Benayadi, Marc Le Goc, Jacques Pinaton
2010 — conf
Modeling Large Scale Manufacturing Process from Timed Data - Using the TOM4L Approach and Sequence Alignment Information for Modeling STMicroelectronics' Production Processes.
ICEIS (2)
Pamela Viale, Nabil Benayadi, Marc Le Goc, Jacques Pinaton