| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | J | jnl |
IEEE Trans. Inf. Forensics Secur.
|
| 2019 | J | jnl |
IEEE Des. Test
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | B | conf |
ETS
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | A | conf |
ICCAD
|
| 2018 | A* | conf |
DAC
|
| 2017 | — | conf |
ATS
|
| 2017 | C | conf |
ICCD
|
| 2016 | A | conf |
ITC
|
| 2016 | C | conf |
ISCAS
|