Jack C. Lee

16 papers Journal 10Unranked 4
YearRankTypeTitle / Venue / Authors
2021 — conf
Embedded emerging memory technologies for neuromorphic computing: temperature instability and reliability.
IRPS
Yao-Feng Chang, Ilya Karpov, Reed Hopkins, David Janosky, Jacob Medeiros, Benjamin Sherrill, Jiahan Zhang, Yifu Huang, Tanmoy Pramanik, Albert B. Chen, Tony Acosta, Abdullah Guler, James A. O'Donnell, Pedro A. Quintero, Nathan Strutt, Oleg Golonzka, Chris Connor, Jack C. Lee, Jeffrey Hicks
2020 J jnl
Complementary Metal-Oxide Semiconductor and Memristive Hardware for Neuromorphic Computing.
Adv. Intell. Syst.
Mostafa Rahimi Azghadi, Ying-Chen Chen, Jason Kamran Eshraghian, Jia Chen, Chih-Yang Lin, Amirali Amirsoleimani, Adnan Mehonic, Anthony J. Kenyon, Burt Fowler, Jack C. Lee, Yao-Feng Chang
2020 J jnl
Complementary Metal-Oxide Semiconductor and Memristive Hardware for Neuromorphic Computing.
Adv. Intell. Syst.
Mostafa Rahimi Azghadi, Ying-Chen Chen, Jason Kamran Eshraghian, Jia Chen, Chih-Yang Lin, Amirali Amirsoleimani, Adnan Mehonic, Anthony J. Kenyon, Burt Fowler, Jack C. Lee, Yao-Feng Chang
2020 — conf
Understanding of Multiple Resistance States by Current-sweep Measurement and Compliance Current Modulation in 2D MoS2-based Non-volatile Resistance Switching Devices.
DRC
Xiaohan Wu, Ruijing Ge, Deji Akinwande, Jack C. Lee
2019 — conf
Resistive Switching Early Failure and Gap Identification in Bilayer Selectorless RRAM Applications.
DRC
Ying-Chen Chen, Szu-Tung Hu, Chao-Cheng Lin, Jack C. Lee
2018 — conf
Nonlinearity Enhancement by Positive Pulse Stress in Multilevel Cell Selectorless RRAM Applications.
DRC
Ying-Chen Chen, Xiaohan Wu, Yao-Feng Chang, Jack C. Lee
2007 J jnl
Robust mixture modeling using the skew
Stat. Comput.
Tsung-I Lin, Jack C. Lee, Wan J. Hsieh
2006 — book
Hf-Based High-k Dielectrics: Process Development, Performance Characterization, and Reliability
Hf-Based High-k Dielectrics
Young-Hee Kim, Jack C. Lee
2006 J jnl
On fast supervised learning for normal mixture models with missing information.
Pattern Recognit.
Tsung-I Lin, Jack C. Lee, Hsiu J. Ho
2005 J jnl
Threshold voltage instability characteristics of HfO
Microelectron. Reliab.
Se Jong Rhee, Jack C. Lee
2004 J jnl
Bayesian analysis of mixture modelling using the multivariate t distribution.
Stat. Comput.
Tsung-I Lin, Jack C. Lee, Huey F. Ni
2004 J jnl
Reliability characteristics of high-k dielectrics.
Microelectron. Reliab.
Young-Hee Kim, Jack C. Lee
2001 J jnl
Populating the Hermitage Museum's new web site.
Commun. ACM
Fred Mintzer, Gordon W. Braudaway, Francis P. Giordano, Jack C. Lee, Karen A. Magerlein, Silvana D'Auria, Amnon Ribak, Gil Shapir, Fabio Schiattarella, John Tolva, Andrey Zelenkov
1996 J jnl
Toward on-line, worldwide access to Vatican Library materials.
IBM J. Res. Dev.
Frederick C. Mintzer, Leonard E. Boyle, Albert N. Cazes, Brian S. Christian, Steven C. Cox, Francis P. Giordano, Henry M. Gladney, Jack C. Lee, Milton L. Kelmanson, Antonio C. Lirani, Karen A. Magerlein, Ana M. B. Pavani, Fabio Schiattarella
1982 — ch.
5 Classification of growth curves.
Classification, Pattern Recognition and Reduction of Dimensionality
Jack C. Lee
1982 J jnl
A VLSI Design Verification Strategy.
IBM J. Res. Dev.
Arnold S. Tran, Richard A. Forsberg, Jack C. Lee