J. Th. van der Linden

12 papers A 8Misc 2Unranked 2

Year	Rank	Type	Title / Venue / Authors
2002	A	`conf`	Test Point Insertion that Facilitates ATPG in Reducing Test Time and Data Volume. ITC M. J. Geuzebroek, J. Th. van der Linden, Ad J. van de Goor
2000	A	`conf`	Test point insertion for compact test sets. ITC M. J. Geuzebroek, J. Th. van der Linden, Ad J. van de Goor
1999	A	`conf`	Illegal State Space Identification for Sequential Circuit Test Generation. DATE M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor
1999	A	`conf`	Testability of the Philips 80C51 micro-controller. ITC M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor
1998	—	`conf`	Complete Search in Test Generation for Industrial Circuits with Improved Bus-Conflict Detection. Asian Test Symposium J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor
1997	A	`conf`	Sequential Test Generation with Advanced Illegal State Search. ITC M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor
1996	A	`conf`	Accelerated Compact Test Set Generation for Three-State Circuits. ITC M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor
1996	—	`conf`	Circuit Partitioned Automatic Test Pattern Generation Constrained by Three-State Buses and Restrictors. Asian Test Symposium J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor
1995	Misc	`conf`	Compact test sets for industrial circuits. VTS M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor
1994	A	`conf`	Parallel Pattern Fast Fault Simulation for Three-State Circuits and Bidirectional I/O. ITC J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor
1994	Misc	`conf`	Test generation and three-state elements, buses, and bidirectionals. VTS J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor
1993	A	`conf`	Test Pattern Generation with Restrictors. ITC M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor