| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 1986 | J | jnl |
IEEE Trans. Computers
|
| 1986 | A | conf |
ITC
|
| 1984 | A | conf |
ITC
|
| 1984 | — | conf |
VLSI Engineering
|
| 1978 | J | jnl |
IEEE Trans. Computers
|
| 1977 | J | jnl |
IEEE Trans. Computers
|
| 1972 | — | conf |
ACM Annual Conference (1)
|
| 1971 | J | jnl |
IEEE Trans. Computers
|
| 1971 | J | jnl |
IEEE Trans. Computers
|
| 1970 | J | jnl |
IEEE Trans. Computers
|
| 1967 | J | jnl |
Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic Circuits.
IEEE Trans. Electron. Comput.
|
| 1965 | — | conf |
AFIPS Fall Joint Computing Conference (1)
|
| 1962 | J | jnl |
IBM J. Res. Dev.
|
| 1961 | — | conf |
SWCT
|
| 1961 | — | conf |
SWCT
|
| 1960 | J | jnl |
IBM J. Res. Dev.
|
| 1959 | J | jnl |
IBM J. Res. Dev.
|