Ivica Manic

17 papers Journal 17
YearRankTypeTitle / Venue / Authors
2022 J jnl
Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress.
J. Circuits Syst. Comput.
Sandra Veljkovic, Nikola Mitrovic, Vojkan Davidovic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, Dencho Spassov, Srboljub Stankovic, Marko S. Andjelkovic, Zoran Prijic, Ivica Manic, Aneta Prijic, Goran S. Ristic, Danijel Dankovic
2018 J jnl
A review of pulsed NBTI in P-channel power VDMOSFETs.
Microelectron. Reliab.
Danijel Dankovic, Ivica Manic, Aneta Prijic, Vojkan Davidovic, Zoran Prijic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, Dencho Spassov, Ninoslav Stojadinovic
2018 J jnl
NBTI and irradiation related degradation mechanisms in power VDMOS transistors.
Microelectron. Reliab.
Ninoslav Stojadinovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Srboljub Stankovic, Aneta Prijic, Zoran Prijic, Ivica Manic, Danijel Dankovic
2015 J jnl
Microwave Engineering: Concepts and Fundamentals, Ahmad Shahid Khan. CRC Press Taylor & Francis Group, Boca Raton (2014). 800 p., Hardcover, ISBN: 9781466591417.
Microelectron. Reliab.
Ivica Manic
2011 J jnl
NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions.
Microelectron. Reliab.
Ivica Manic, Danijel Dankovic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic, Ninoslav Stojadinovic
2010 J jnl
Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress.
Microelectron. Reliab.
Ninoslav Stojadinovic, Danijel Dankovic, Ivica Manic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic
2009 J jnl
Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs.
Microelectron. Reliab.
Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Ninoslav Stojadinovic
2008 J jnl
Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs.
IET Circuits Devices Syst.
Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Danijel Dankovic, Snezana Golubovic, Ninoslav Stojadinovic
2008 J jnl
Negative bias temperature instability in n-channel power VDMOSFETs.
Microelectron. Reliab.
Danijel Dankovic, Ivica Manic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Ninoslav Stojadinovic
2007 J jnl
Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs.
Microelectron. Reliab.
Danijel Dankovic, Ivica Manic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Ninoslav Stojadinovic
2006 J jnl
NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs.
Microelectron. Reliab.
Danijel Dankovic, Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Ninoslav Stojadinovic
2005 J jnl
Effects of electrical stressing in power VDMOSFETs.
Microelectron. Reliab.
Ninoslav Stojadinovic, Ivica Manic, Vojkan Davidovic, Danijel Dankovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Sima Dimitrijev
2005 J jnl
Negative bias temperature instability mechanisms in p-channel power VDMOSFETs.
Microelectron. Reliab.
Ninoslav Stojadinovic, Danijel Dankovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Ivica Manic, Snezana Golubovic
2003 J jnl
Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs.
Microelectron. Reliab.
Snezana Djoric-Veljkovic, Ivica Manic, Vojkan Davidovic, Snezana Golubovic, Ninoslav Stojadinovic
2002 J jnl
Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs.
Microelectron. Reliab.
Ninoslav Stojadinovic, Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Sima Dimitrijev
2002 J jnl
Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs.
Microelectron. Reliab.
Ninoslav Stojadinovic, Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Danijel Dankovic, Snezana Golubovic, Sima Dimitrijev
2001 J jnl
Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs.
Microelectron. Reliab.
Ninoslav Stojadinovic, Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Sima Dimitrijev