Ismed Hartanto

14 papers A* 1A 5Misc 4Journal 1Unranked 3
YearRankTypeTitle / Venue / Authors
2017 — conf
Cell-Aware ATPG to Improve Defect Coverage for FPGA IPs and Next Generation Zynq® MPSoCs.
ATS
Seetal Potluri, Aaron Mathew, Rambabu Nerukonda, Ismed Hartanto, Shahin Toutounchi
2007 — conf
Using FPGA configuration memory to accelerate yield learning for advanced process.
ATS
Jenny Fan, Xiaoyu Li, Ismed Hartanto
2002 A conf
Multiplets, Models, and the Search for Meaning: Improving Per-Test Fault Diagnosis.
ITC
David B. Lavo, Ismed Hartanto, Tracy Larrabee
2001 J jnl
Diagnostic simulation of stuck-at faults in sequential circuits using compact lists.
ACM Trans. Design Autom. Electr. Syst.
Ismed Hartanto, Srikanth Venkataraman, W. Kent Fuchs, Elizabeth M. Rudnick, Janak H. Patel, Sreejit Chakravarty
2000 A conf
Comparing functional and structural tests.
ITC
Peter C. Maxwell, Ismed Hartanto, Lee Bentz
1998 A conf
Probabilistic mixed-model fault diagnosis.
ITC
David B. Lavo, Brian Chess, Tracy Larrabee, Ismed Hartanto
1997 Misc conf
Characterization and Implicit Identification of Sequential Indistinguishability.
VLSI Design
Vamsi Boppana, Ismed Hartanto, W. Kent Fuchs
1997 Misc conf
Diagnostic Test Pattern Generation for Sequential Circuits.
VTS
Ismed Hartanto, Vamsi Boppana, Janak H. Patel, W. Kent Fuchs
1996 A conf
Diagnostic Fault Equivalence Identification Using Redundancy Information and Structural Analysis.
ITC
Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs
1996 Misc conf
Dynamic diagnosis of sequential circuits based on stuck-at faults.
VTS
Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs
1996 — conf
Fault Diagnosis Using State Information.
FTCS
Vamsi Boppana, Ismed Hartanto, W. Kent Fuchs
1996 Misc conf
Full fault dictionary storage based on labeled tree encoding.
VTS
Vamsi Boppana, Ismed Hartanto, W. Kent Fuchs
1996 A conf
Identification of unsettable flip-flops for partial scan and faster ATPG.
ICCAD
Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs
1995 A* conf
Rapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact Lists.
DAC
Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs, Elizabeth M. Rudnick, Sreejit Chakravarty, Janak H. Patel