Isaac Bruce

22 papers A 2B 2C 1Misc 1Journal 6Unranked 9
YearRankTypeTitle / Venue / Authors
2026 J jnl
Gradient Minimization in Layout Patterns for Analog Circuits.
Circuits Syst. Signal Process.
Isaac Bruce, Michael Sekyere, Ruohan Yang, Saeid Karimpour, Colin C. McAndrew, Degang Chen
2025 C conf
A Compact 3-Segment 15-bit Capacitive DAC with Digital Calibration for Improved Linearity.
ISCAS
Emmanuel Nti Darko, Isaac Bruce, Ekaniyere Oko-Odion, Saeid Karimpour, Kushagra Bhatheja, Degang Chen
2025 J jnl
Digitally Calibrated Redundancy-Based String DAC: A Novel Architecture for Enhanced Static Linearity.
IEEE Trans. Circuits Syst. II Express Briefs
Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Matthew Crabb, Degang Chen
2025 — conf
Efficient Hybrid Resistor-String and Capacitor DAC with Area Efficient Redundancy-Based Digital Calibration for High-Performance Applications.
I2MTC
Ekaniyere Oko-Odion, Emmanuel Nti Darko, Isaac Bruce, Matthew Crabb, Degang Chen
2025 J jnl
Matching Critical Analog Circuit Components Up To Third-Order Gradients for All Possible Exact Matching Ratios.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Michael Sekyere, Isaac Bruce, Ruohan Yang, Degang Chen, Colin C. McAndrew, Xiankun Jin, Chen He, Doug Garrity
2024 — conf
A 3-Segment Interpolating String DAC with Low-Cost Built-In-Self-Test Capabilities.
ISVLSI
Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Matthew Crabb, Degang Chen
2024 J jnl
A BIST Approach to Approximate Co-Testing of Embedded Data Converters.
IEEE Des. Test
Kushagra Bhatheja, Shravan K. Chaganti, Johnathan Leisinger, Emmanuel Nti Darko, Isaac Bruce, Degang Chen
2024 — conf
A Direct Current-to-digital converter (DCDC) for Advanced Current Measurement in System-on-Chip (SOC) Designs.
MWSCAS
Saeid Karimpour, Isaac Bruce, Michael Sekyere, Ruohan Yang, Emmanuel Nti Darko, Degang Chen
2024 — —
Performance enhancement strategies for design and test Optimization of analog and mixed-signal circuits.
Isaac Bruce
2024 — conf
Redundancy Based Resistor String DAC with an all Digital Calibration Algorithm.
MWSCAS
Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Matthew Crabb, Degang Chen
2024 — conf
Ultra-Small Area, Highly Linear, Modified All Mosfet Digital-to-Analog Converters with Novel Real Time Digital Calibration Algorithm.
ISVLSI
Ekaniyere Oko-Odion, Isaac Bruce, Emmanuel Nti Darko, Michael Sekyere, Degang Chen
2023 J jnl
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing.
J. Electron. Test.
Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2023 — conf
Small Area, High Accuracy Sub-Radix Resistive Current Mode Digital-To-Analog Converter with Novel Calibration Algorithm.
MWSCAS
Isaac Bruce, Michael Sekyere, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen
2023 — conf
Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-Analog Converters with Novel Calibration Algorithm.
MWSCAS
Michael Sekyere, Emmanuel Nti Darko, Isaac Bruce, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen
2022 J jnl
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing.
J. Electron. Test.
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022 — conf
Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing.
DFT
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022 B conf
Graph Theory Approach for Multi-site ATE Board Parameter Extraction.
ETS
Abraham Steenhoek, Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022 A conf
Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing.
ITC
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022 Misc conf
The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing.
VTS
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2021 B conf
An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study.
ETS
Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2021 — conf
Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation.
DTIS
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2021 A conf
Systematic Hardware Error Identification and Calibration for Massive Multisite Testing.
ITC
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen