Innocent Agbo - RankMe

17 papers A 4B 2C 1Misc 1Journal 4Unranked 5

Year	Rank	Type	Title / Venue / Authors
2020	—	`conf`	Big Data Architecture: Designing the Right Solution for Social Network Analysis. ISDFS Innocent Agbo, Alexander V. Kupriyanov, Igor Rytsarev
2019	B	`conf`	Hardware-Based Aging Mitigation Scheme for Memory Address Decoder. ETS Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor
2019	A	`conf`	Methodology for Application-Dependent Degradation Analysis of Memory Timing. DATE Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor
2019	J	`jnl`	Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM. IEEE Trans. Very Large Scale Integr. Syst. Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor
2018	A	`conf`	Degradation analysis of high performance 14nm FinFET SRAM. DATE Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor
2018	J	`jnl`	Impact and mitigation of SRAM read path aging. Microelectron. Reliab. Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene
2017	J	`jnl`	Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads. IEEE Trans. Very Large Scale Integr. Syst. Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor
2017	J	`jnl`	Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier. IEEE Trans. Very Large Scale Integr. Syst. Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor
2017	A	`conf`	Mitigation of sense amplifier degradation using input switching. DATE Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene
2016	C	`conf`	Comparative BTI analysis for various sense amplifier designs. DDECS Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor
2016	—	`conf`	Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability. ISVLSI Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene
2016	B	`conf`	Read path degradation analysis in SRAM. ETS Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene
2015	—	`conf`	BTI analysis of SRAM write driver. IDT Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor
2015	—	`conf`	Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier. DTIS Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Stefan Cosemans, Pieter Weckx, Praveen Raghavan, Francky Catthoor
2015	Misc	`conf`	Integral impact of BTI and voltage temperature variation on SRAM sense amplifier. VTS Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor
2014	A	`conf`	Bias Temperature Instability analysis of FinFET based SRAM cells. DATE Seyab Khan, Innocent Agbo, Said Hamdioui, Halil Kukner, Ben Kaczer, Praveen Raghavan, Francky Catthoor
2013	—	`conf`	BTI impact on SRAM sense amplifier. IDT Innocent Agbo, Seyab Khan, Said Hamdioui