| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
SMACD
|
| 2025 | B | conf |
ETS
|
| 2025 | J | jnl |
J. Circuits Syst. Comput.
|
| 2025 | — | conf |
ATS
|
| 2025 | — | conf |
ATS
|
| 2025 | — | conf |
ACNS Workshops (1)
|
| 2025 | A | conf |
ITC
|
| 2025 | — | conf |
SOCC
|
| 2025 | J | jnl |
CoRR
|
| 2025 | C | conf |
ISCAS
|
| 2025 | C | conf |
ICCE
|
| 2025 | B | conf |
ETS
|
| 2025 | A | conf |
DATE
|
| 2025 | B | conf |
ETS
|
| 2025 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2024 | — | conf |
AICAS
|
| 2024 | — | conf |
COINS
|
| 2024 | — | conf |
ATS
|
| 2024 | — | conf |
DFT
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
Cryptogr.
|
| 2024 | J | jnl |
Sensors
|
| 2024 | — | conf |
ATS
|
| 2024 | B | conf |
ETS
|
| 2024 | — | conf |
DFT
|
| 2024 | C | conf |
DDECS
|
| 2024 | C | conf |
Refinement and Empirical Side-Channel Analysis of Inner Product Masking with Robust Error Detection.
IOLTS
|
| 2024 | Misc | conf |
VTS
|
| 2024 | J | jnl |
Entropy
|
| 2024 | B | conf |
ETS
|
| 2023 | C | conf |
DSD
|
| 2023 | B | conf |
ETS
|
| 2023 | B | conf |
ETS
|
| 2023 | J | jnl |
Quantum Inf. Process.
|
| 2023 | C | conf |
ICISSP
|
| 2023 | — | conf |
ICECS
|
| 2023 | — | conf |
HOST
|
| 2023 | J | jnl |
IEEE Trans. Inf. Forensics Secur.
|
| 2023 | Misc | conf |
QCE
|
| 2023 | J | jnl |
CoRR
|
| 2023 | — | conf |
NEWCAS
|
| 2023 | J | jnl |
CoRR
|
| 2023 | B | conf |
ETS
|
| 2023 | — | conf |
ATS
|
| 2023 | — | conf |
DSN-W
|
| 2022 | Misc | conf |
QCE
|
| 2022 | A | conf |
ICME
|
| 2022 | A | conf |
DATE
|
| 2022 | B | conf |
ETS
|
| 2022 | B | conf |
ETS
|
| 2022 | — | conf |
AsianHOST
|
| 2022 | J | jnl |
Physics inspired compact modelling of BiFeO$_3$ based memristors for hardware security applications.
CoRR
|
| 2022 | C | conf |
DDECS
|
| 2022 | C | conf |
ISCAS
|
| 2021 | B | conf |
ETS
|
| 2021 | — | conf |
NANOARCH
|
| 2021 | J | jnl |
CoRR
|
| 2021 | C | conf |
DSD
|
| 2021 | J | jnl |
IEEE Des. Test
|
| 2021 | J | jnl |
J. Cryptogr. Eng.
|
| 2021 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2021 | A | conf |
DATE
|
| 2021 | — | conf |
CF
|
| 2021 | A | conf |
ICCAD
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
CAAI Trans. Intell. Technol.
|
| 2021 | B | conf |
ETS
|
| 2021 | Misc | conf |
VTS
|
| 2021 | Misc | conf |
VTS
|
| 2021 | C | conf |
IOLTS
|
| 2021 | C | conf |
VLSI-SoC
|
| 2020 | — | conf |
ISVLSI
|
| 2020 | — | conf |
Media Watermarking, Security, and Forensics
|
| 2020 | J | jnl |
J. Cryptogr. Eng.
|
| 2020 | — | conf |
ATS
|
| 2020 | C | conf |
ICCD
|
| 2020 | A | conf |
ICCAD
|
| 2020 | — | conf |
ISVLSI
|
| 2020 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2020 | A | conf |
DATE
|
| 2020 | J | jnl |
CoRR
|
| 2019 | — | conf |
PROOFS
|
| 2019 | — | ed. |
COSADE
|
| 2019 | — | conf |
IVSW
|
| 2019 | — | conf |
NEWCAS
|
| 2019 | — | conf |
SAMOS
|
| 2019 | C | conf |
FDTC
|
| 2019 | J | jnl |
it Inf. Technol.
|
| 2019 | J | jnl |
IEEE Trans. Emerg. Top. Comput.
|
| 2019 | — | conf |
ICRC
|
| 2019 | — | conf |
CF
|
| 2019 | J | jnl |
Dagstuhl Reports
|
| 2019 | B | conf |
ETS
|
| 2019 | J | jnl |
IEEE Embed. Syst. Lett.
|
| 2018 | — | conf |
PROOFS
|
| 2018 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2018 | — | conf |
EWME
|
| 2018 | — | conf |
SAMOS
|
| 2018 | J | jnl |
Microprocess. Microsystems
|
| 2018 | — | conf |
DCIS
|
| 2018 | A | conf |
ICCAD
|
| 2018 | J | jnl |
IEEE Embed. Syst. Lett.
|
| 2017 | A | conf |
DATE
|
| 2017 | C | conf |
FDTC
|
| 2017 | C | conf |
DSD
|
| 2017 | B | conf |
ETS
|
| 2017 | A | conf |
DATE
|
| 2017 | — | conf |
SoCC
|
| 2017 | — | conf |
ASP-DAC
|
| 2017 | A | conf |
DATE
|
| 2017 | — | conf |
IVSW
|
| 2016 | — | conf |
WSA
|
| 2016 | B | conf |
ETS
|
| 2016 | J | jnl |
Dagstuhl Reports
|
| 2016 | A | conf |
DATE
|
| 2016 | — | conf |
EUSIPCO
|
| 2016 | — | conf |
ATS
|
| 2016 | J | jnl |
IEEE Trans. Computers
|
| 2015 | C | conf |
RC
|
| 2015 | A* | conf |
DAC
|
| 2015 | A | conf |
DATE
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | — | conf |
ATS
|
| 2014 | C | conf |
DDECS
|
| 2014 | Misc | conf |
VLSID
|
| 2014 | C | conf |
RC
|
| 2014 | B | conf |
ETS
|
| 2014 | J | jnl |
IET Comput. Digit. Tech.
|
| 2014 | J | jnl |
it Inf. Technol.
|
| 2014 | C | conf |
FDTC
|
| 2014 | J | jnl |
IACR Cryptol. ePrint Arch.
|
| 2014 | J | jnl |
IACR Cryptol. ePrint Arch.
|
| 2014 | C | conf |
IOLTS
|
| 2014 | — | conf |
DFT
|
| 2014 | — | conf |
WiSEE
|
| 2014 | Misc | conf |
VLSID
|
| 2014 | A | conf |
DATE
|
| 2014 | — | conf |
Technische Informatik in der universitären Lehre: Bestandsaufnahme, Herausforderungen, Perspektiven.
Aspekte der Technischen Informatik
|
| 2014 | B | conf |
ETS
|
| 2013 | — | conf |
DFTS
|
| 2013 | A | conf |
DATE
|
| 2013 | C | conf |
DDECS
|
| 2013 | — | conf |
Asian Test Symposium
|
| 2013 | J | jnl |
IACR Cryptol. ePrint Arch.
|
| 2013 | — | conf |
LATW
|
| 2013 | — | conf |
ASP-DAC
|
| 2013 | J | jnl |
IEEE Des. Test
|
| 2013 | Misc | conf |
VTS
|
| 2012 | — | conf |
DFT
|
| 2012 | — | conf |
COSADE
|
| 2012 | J | jnl |
IACR Cryptol. ePrint Arch.
|
| 2012 | C | conf |
IOLTS
|
| 2012 | — | conf |
ASP-DAC
|
| 2012 | A | conf |
ITC
|
| 2012 | B | conf |
ETS
|
| 2012 | A | conf |
DATE
|
| 2012 | B | conf |
ETS
|
| 2012 | Misc | conf |
VTS
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2012 | A | conf |
ICCAD
|
| 2012 | — | conf |
NANOARCH
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2011 | A | conf |
DATE
|
| 2011 | C | conf |
IOLTS
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2011 | C | conf |
IOLTS
|
| 2011 | J | jnl |
IEEE Trans. Dependable Secur. Comput.
|
| 2011 | C | conf |
DDECS
|
| 2011 | J | jnl |
IEEE Des. Test Comput.
|
| 2011 | B | conf |
ETS
|
| 2011 | B | conf |
ETS
|
| 2011 | J | jnl |
Sci. China Inf. Sci.
|
| 2010 | — | conf |
EWDTS
|
| 2010 | J | jnl |
it Inf. Technol.
|
| 2010 | — | conf |
DSN Workshops
|
| 2010 | J | jnl |
J. Low Power Electron.
|
| 2010 | Misc | conf |
VTS
|
| 2010 | J | jnl |
Int. J. Parallel Program.
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2009 | C | conf |
IOLTS
|
| 2009 | Misc | conf |
VTS
|
| 2009 | A | conf |
DATE
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2009 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2009 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2009 | Misc | conf |
VLSI Design
|
| 2008 | B | conf |
ETS
|
| 2008 | A | conf |
DSN
|
| 2008 | Misc | conf |
VTS
|
| 2008 | C | conf |
DDECS
|
| 2008 | A | conf |
ITC
|
| 2008 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2008 | — | conf |
DFT
|
| 2008 | A | conf |
DATE
|
| 2008 | — | conf |
ISVLSI
|
| 2008 | B | conf |
ETS
|
| 2008 | — | conf |
DFT
|
| 2007 | Misc | conf |
VTS
|
| 2007 | J | jnl |
CoRR
|
| 2007 | J | jnl |
CoRR
|
| 2007 | J | jnl |
J. Electron. Test.
|
| 2007 | C | conf |
IOLTS
|
| 2007 | J | jnl |
IEEE Des. Test Comput.
|
| 2007 | — | conf |
ATS
|
| 2007 | — | conf |
ATS
|
| 2006 | — | conf |
WCET
|
| 2006 | — | conf |
ATS
|
| 2006 | C | conf |
IOLTS
|
| 2006 | C | conf |
DDECS
|
| 2006 | J | jnl |
J. Electron. Test.
|
| 2006 | J | jnl |
it Inf. Technol.
|
| 2006 | — | conf |
ATS
|
| 2006 | A | conf |
DATE
|
| 2006 | — | conf |
DFT
|
| 2006 | C | conf |
ICCD
|
| 2006 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2006 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2005 | A | conf |
DATE
|
| 2005 | J | jnl |
J. Electron. Test.
|
| 2005 | J | jnl |
it Inf. Technol.
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2005 | Misc | conf |
VTS
|
| 2005 | A | conf |
ITC
|
| 2004 | B | conf |
ETS
|
| 2004 | — | conf |
MBMV
|
| 2004 | J | jnl |
J. Electron. Test.
|
| 2004 | — | conf |
Asian Test Symposium
|
| 2004 | Misc | conf |
VTS
|
| 2004 | A | conf |
ITC
|
| 2003 | A | conf |
DATE
|
| 2003 | — | conf |
ETW
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2003 | — | ch. |
Ausgezeichnete Informatikdissertationen
|
| 2003 | J | jnl |
Integr.
|
| 2003 | C | conf |
VLSI-SOC
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2003 | A | conf |
ITC
|
| 2003 | — | conf |
MBMV
|
| 2002 | — | conf |
ISMVL
|
| 2002 | — | conf |
Asian Test Symposium
|
| 2002 | — | conf |
IOLTW
|
| 2002 | — | conf |
ETW
|
| 2002 | — | conf |
IOLTW
|
| 2001 | — | conf |
Asian Test Symposium
|
| 2001 | — | conf |
MBMV (1)
|
| 2001 | — | conf |
LATW
|
| 2001 | Misc | conf |
VTS
|
| 1999 | — | conf |
ETW
|