Ilgu Yun

29 papers C 1Journal 23Unranked 5
YearRankTypeTitle / Venue / Authors
2022 — conf
Self-heating effect of GAAFET and FinFET for over 2-V applications using TCAD simulation.
ICEIC
Seungju Hwang, Ilgu Yun
2018 — conf
Compact Drain Current Model of Nanoscale FinFET Considering Short Channel Effect in Ballistic Transport Regime.
SMACD
Min Soo Bae, Chuntaek Park, Ilgu Yun
2018 — conf
Modeling and Simulation of Novel GaN-based Light Emitting Transistor for Display Applications.
PRIME
Sang Myung Lee, Ilgu Yun
2017 J jnl
Effect of selectively passivated layer on foldable low temperature polycrystalline silicon thin film transistor characteristics under dynamic mechanical stress.
Microelectron. Reliab.
Sang Myung Lee, Ilgu Yun
2017 J jnl
Mechanical stress-induced degradation model of amorphous InGaZnO thin film transistors by strain-initiated defect generation.
Microelectron. Reliab.
Chuntaek Park, Ilgu Yun
2017 J jnl
Structure variation effects on device reliability of single photon avalanche diodes.
Microelectron. Reliab.
Dongseok Shin, Byungchoul Park, Youngcheol Chae, Ilgu Yun
2016 J jnl
Crack-guided effect on dynamic mechanical stress for foldable low temperature polycrystalline silicon thin film transistors.
Microelectron. Reliab.
Sang Myung Lee, Chuntaek Park, Ilgu Yun
2016 J jnl
Instability of oxide thin film transistor under electrical-mechanical hybrid stress for foldable display.
Microelectron. Reliab.
Dongseok Shin, Min Soo Bae, Ilgu Yun
2016 J jnl
Plasma Process Uniformity Diagnosis Technique Using Optical Emission Spectroscopy With Spatially Resolved Ring Lens.
IEEE Trans. Ind. Electron.
In Joong Kim, Ilgu Yun
2015 J jnl
An analytical avalanche breakdown model for double gate MOSFET.
Microelectron. Reliab.
Edward Namkyu Cho, Yong-Hyeon Shin, Ilgu Yun
2015 J jnl
Effect of electric field polarity on inter-poly dielectric during cell operation for the retention characteristics.
Microelectron. Reliab.
Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Ilgu Yun
2015 J jnl
Reliability modeling and analysis of flicker noise for pore structure in amorphous chalcogenide-based phase-change memory devices.
Microelectron. Reliab.
Jun Yeong Lim, Ilgu Yun
2014 J jnl
Conduction instability of amorphous InGaZnO thin-film transistors under constant drain current stress.
Microelectron. Reliab.
Jung Han Kang, Edward Namkyu Cho, Ilgu Yun
2013 J jnl
Methodology for improvement of data retention in floating gate flash memory using leakage current estimation.
Microelectron. Reliab.
Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Sung-Kye Park, Ilgu Yun
2012 J jnl
Experimental observation of gate geometry dependent characteristic degradations of the multi-finger MOSFETs.
Microelectron. Reliab.
Mingu Kang, Ilgu Yun
2012 J jnl
Modeling and optimization of ITO/Al/ITO multilayer films characteristics using neural network and genetic algorithm.
Expert Syst. Appl.
Edward Namkyu Cho, Pyung Moon, Chang Eun Kim, Ilgu Yun
2012 J jnl
Threshold voltage shift prediction for gate bias stress on amorphous InGaZnO thin film transistors.
Microelectron. Reliab.
Suehye Park, Edward Namkyu Cho, Ilgu Yun
2011 J jnl
Effects of channel thickness variation on bias stress instability of InGaZnO thin-film transistors.
Microelectron. Reliab.
Edward Namkyu Cho, Jung Han Kang, Ilgu Yun
2011 J jnl
Process estimation and optimized recipes of ZnO: Ga thin film characteristics for transparent electrode applications.
Expert Syst. Appl.
Chang Eun Kim, Pyung Moon, Ilgu Yun, SungYeon Kim, Jae-Min Myoung, Hyeon Woo Jang, Jungsik Bang
2009 J jnl
Modeling and optimization of the growth rate for ZnO thin films using neural networks and genetic algorithms.
Expert Syst. Appl.
Young-Don Ko, Pyung Moon, Chang Eun Kim, Moon-Ho Ham, Jae-Min Myoung, Ilgu Yun
2009 J jnl
Reliability assessment of 1.55-µm vertical cavity surface emitting lasers with tunnel junction using high-temperature aging tests.
Microelectron. Reliab.
Keun Ho Rhew, Su Chang Jeon, Dae Hee Lee, Byueng-Su Yoo, Ilgu Yun
2008 J jnl
Neural network modeling of the cellgap process for liquid crystal display fabricated on plastic substrates.
Expert Syst. Appl.
Jung Hwan Lee, Dong-Hun Kang, Young-Don Ko, Jaejin Jang, Dae-Shik Seo, Ilgu Yun
2007 J jnl
Degradation analysis in asymmetric sampled grating distributed feedback laser diodes.
Microelectron. J.
Han Sung Joo, Sang-Wan Ryu, Jeha Kim, Ilgu Yun
2007 — conf
Effect of the principal component on the PCA-based neural network model for HFO2 thin film characteristics.
Artificial Intelligence and Applications
Young-Don Ko, Moon-Ho Ham, Jae-Min Myoung, Ilgu Yun
2007 J jnl
Neural network based modeling of HfO
Expert Syst. Appl.
Kyoung Eun Kweon, Jung Hwan Lee, Young-Don Ko, Min-Chang Jeong, Jae-Min Myoung, Ilgu Yun
2006 J jnl
Modeling growth rate of HfO
Microelectron. J.
Myoung-Seok Kim, Young-Don Ko, Tae-Houng Moon, Jae-Min Myoung, Ilgu Yun
2006 — conf
PCA-Based Neural Network Modeling Using the Photoluminescence Data for Growth Rate of ZnO Thin Films Fabricated by Pulsed Laser Deposition.
ISNN (2)
Jung Hwan Lee, Young-Don Ko, Min-Chang Jeong, Jae-Min Myoung, Ilgu Yun
2004 C conf
An In-Order SMT Architecture with Static Resource Partitioning for Consumer Applications.
PDCAT
Byung In Moon, Hongil Yoon, Ilgu Yun, Sungho Kang
2004 J jnl
Investigation of manufacturing variations of planar InP/InGaAs avalanche photodiodes for optical receivers.
Microelectron. J.
Bongyong Lee, Hongil Yoon, Kyung Sook Hyun, Yong Hwan Kwon, Ilgu Yun