Igor A. Kharitonov

16 papers C 1Journal 3Unranked 12
YearRankTypeTitle / Venue / Authors
2021 J jnl
SPICE Compact BJT, MOSFET, and JFET Models for ICs Simulation in the Wide Temperature Range (From -200 °C to +300 °C).
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Konstantin O. Petrosyants, Lev M. Sambursky, Maxim V. Kozhukhov, Mamed R. Ismail-Zade, Igor A. Kharitonov, Bo Li
2018 — conf
SPICE Simulation of Total Dose and Aging Effects in MOSFET Circuits.
EWDTS
Konstantin O. Petrosyants, Igor A. Kharitonov
2017 J jnl
Electrical characterization and reliability of submicron SOI CMOS technology in the extended temperature range (to 300 °C).
Microelectron. Reliab.
Konstantin O. Petrosyants, Igor A. Kharitonov, Sergey V. Lebedev, Lev M. Sambursky, Sergey O. Safonov, Veniamin G. Stakhin
2017 — conf
Electro-thermo-rad SPICE models for SOI/SOS MOSFETs.
EWDTS
Igor A. Kharitonov
2017 — conf
Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications.
EWDTS
Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Mamed R. Ismail-Zade
2017 J jnl
Radiation-Induced Fault Simulation of SOI/SOS CMOS LSI's Using Universal Rad-SPICE MOSFET Model.
J. Electron. Test.
Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Boris G. Lvov
2016 — conf
Fault simulation in radiation-hardened SOI CMOS VLSIs using universal compact MOSFET model.
LATS
Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Boris G. Lvov
2014 — conf
Analysis and Simulation of temperature-current rise in modern PCB traces.
EWDTS
Konstantin O. Petrosyants, Artur Kortunov, Igor A. Kharitonov, Anton Popov, Natalya Gomanilova, Nikita I. Rjabov
2014 — conf
The system of microelectronics education for aerospace industry based on "university-enterprise" link.
EWME
A. N. Tikhonov, Boris G. Lvov, Konstantin O. Petrosyants, Saygid U. Uvaysov, Igor A. Kharitonov, S. V. Balakin, A. N. Chetyrkin, V. N. Krutikov
2013 C conf
Account for Radiation Effects in Signal Integrity Analysis of PCB Digital Systems.
DSD
Konstantin O. Petrosyants, Igor A. Kharitonov
2013 — conf
Coupled TCAD-SPICE simulation of parasitic BJT effect on SOI CMOS SRAM SEU.
EWDTS
Konstantin O. Petrosyants, Igor A. Kharitonov, D. A. Popov
2013 — conf
New version of automated electro-thermal analysis in Mentor Graphics PCB Design System.
EWDTS
Konstantin O. Petrosyants, P. A. Kozynko, Igor A. Kharitonov, A. V. Sidorov, Y. N. Chichkanov
2013 — conf
Simulation of total dose influence on analog-digital SOI/SOS CMOS circuits with EKV-RAD macromodel.
EWDTS
Konstantin O. Petrosyants, Igor A. Kharitonov, Lev M. Sambursky, V. N. Bogatyrev, Z. M. Povarnitcyna, E. S. Drozdenko
2011 — conf
TCAD-SPICE simulation of MOSFET switch delay time for different CMOS technologies.
EWDTS
Konstantin O. Petrosyants, E. V. Orekhov, D. A. Popov, Igor A. Kharitonov, Lev M. Sambursky, A. P. Yatmanov, A. V. Voevodin, A. N. Mansurov
2002 — conf
Multi-Level Testing Strategy for Radiation Hardened SOI/SOS ICs.
LATW
Konstantin O. Petrosjanc, Igor A. Kharitonov, Alexej S. Adonin
1995 — conf
Software system for semiconductor devices, monolith and hybrid ICs thermal analysis.
EURO-DAC
Konstantin O. Petrosjanc, Igor A. Kharitonov, N. I. Rybov, Peter P. Maltcev