| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2023 | C | conf |
FIE
|
| 2017 | J | jnl |
Microelectron. J.
|
| 2016 | — | conf |
ICM
|
| 2016 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2015 | — | conf |
MWSCAS
|
| 2015 | C | conf |
ISCAS
|
| 2014 | A | conf |
ITC
|
| 2014 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2011 | — | conf |
ICECS
|
| 2010 | A | conf |
ITC
|
| 2010 | — | conf |
Asian Test Symposium
|