Ichiro Omura

27 papers Journal 25Unranked 2
YearRankTypeTitle / Venue / Authors
2021 J jnl
Multipurpose Strategy for Energy Storage System Based on Capital Asset Pricing Model With Ensemble Approach.
IEEE Access
Kazufumi Yuasa, Miki Ueshima, Tadatoshi Babasaki, Ichiro Omura
2019 — conf
Switching of 3300V Scaled IGBT by 5V Gate Drive.
ASICON
Toshiro Hiramoto, Katsumi Satoh, Tomoko Matsudai, Wataru Saito, Kuniyuki Kakushima, Takuya Hoshii, Kazuyoshi Furukawa, Masahiro Watanabe, Naoyuki Shigyo, Hitoshi Wakabayashi, Kazuo Tsutsui, Hiroshi Iwai, Atsushi Ogura, Shinichi Nishizawa, Ichiro Omura, Hiromichi Ohashi, Kazuo Itou, Toshihiro Takakura, Munetoshi Fukui, Shinichi Suzuki, Ken Takeuchi, Masanori Tsukuda, Yohichiroh Numasawa
2018 J jnl
A fully digital feedback control of gate driver for current balancing of parallel connected power devices.
Microelectron. Reliab.
Ravi N. Tripathi, Masanori Tsukuda, Ichiro Omura
2018 J jnl
A power cycling degradation inspector of power semiconductor devices.
Microelectron. Reliab.
Akihiko Watanabe, Ichiro Omura
2018 J jnl
Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena.
Microelectron. Reliab.
Masanori Tsukuda, Seiya Abe, Kazunori Hasegawa, Tamotsu Ninomiya, Ichiro Omura
2018 J jnl
ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier.
Microelectron. Reliab.
Kazunori Hasegawa, Shinichi Nishizawa, Ichiro Omura
2018 J jnl
Envelop tracking based embedded current measurement for monitoring of IGBT and power converter system.
Microelectron. Reliab.
Bat-Otgon Bat-Ochir, Battuvshin Bayarkhuu, Kazunori Hasegawa, Masanori Tsukuda, Bayasgalan Dugarjav, Ichiro Omura
2017 — conf
3D scaling for insulated gate bipolar transistors (IGBTs) with low Vce(sat).
ASICON
Kazuo Tsutsui, Kuniyuki Kakushima, Takuya Hoshii, A. Nakajima, Shinichi Nishizawa, Hitoshi Wakabayashi, Iriya Muneta, K. Sato, Tomoko Matsudai, Wataru Saito, Takuya Saraya, K. Itou, M. Fukui, S. Suzuki, Masaharu Kobayashi, T. Takakura, Toshiro Hiramoto, Atsushi Ogura, Y. Numasawa, Ichiro Omura, Hiromichi Ohashi, Hiroshi Iwai
2017 J jnl
Clamp type built-in current sensor using PCB in high-voltage power modules.
Microelectron. Reliab.
Masanori Tsukuda, K. Nakashima, S. Tabata, Kazunori Hasegawa, Ichiro Omura
2017 J jnl
Modelling of the shoot-through phenomenon introduced by the next generation IGBT in inverter applications.
Microelectron. Reliab.
Seiya Abe, Kazunori Hasegawa, Masanori Tsukuda, Keiji Wada, Ichiro Omura, Tamotsu Ninomiya
2017 J jnl
Real-time imaging of temperature distribution inside a power device under a power cycling test.
Microelectron. Reliab.
Akihiko Watanabe, R. Nagao, Ichiro Omura
2016 J jnl
Design and Analysis of a New Evaluation Circuit for Capacitors Used in a High-Power Three-Phase Inverter.
IEEE Trans. Ind. Electron.
Kazunori Hasegawa, Ichiro Omura, Shinichi Nishizawa
2016 J jnl
Failure rate calculation method for high power devices in space applications at low earth orbit.
Microelectron. Reliab.
Erdenebaatar Dashdondog, Shohei Harada, Yuji Shiba, Ichiro Omura
2016 J jnl
Micro PCB Rogowski coil for current monitoring and protection of high voltage power modules.
Microelectron. Reliab.
Masanori Tsukuda, Masahiro Koga, Kenta Nakashima, Ichiro Omura
2016 J jnl
Temperature rise measurement for power-loss comparison of an aluminum electrolytic capacitor between sinusoidal and square-wave current injections.
Microelectron. Reliab.
Kazunori Hasegawa, Kentaro Kozuma, Kousuke Tsuzaki, Ichiro Omura, Shinichi Nishizawa
2015 J jnl
16-Channel micro magnetic flux sensor array for IGBT current distribution measurement.
Microelectron. Reliab.
H. Tomonaga, Masanori Tsukuda, S. Okoda, R. Noda, K. Tashiro, Ichiro Omura
2015 J jnl
Failure analysis of power devices based on real-time monitoring.
Microelectron. Reliab.
Akihiko Watanabe, Masanori Tsukuda, Ichiro Omura
2015 J jnl
High-throughput and full automatic DBC-module screening tester for high power IGBT.
Microelectron. Reliab.
Masanori Tsukuda, H. Tomonaga, S. Okoda, R. Noda, K. Tashiro, Ichiro Omura
2014 J jnl
Short-circuit protection for an IGBT with detecting the gate voltage and gate charge.
Microelectron. Reliab.
Kazunori Hasegawa, Kenichi Yamamoto, Hidetaro Yoshida, Kota Hamada, Masanori Tsukuda, Ichiro Omura
2014 J jnl
Structure oriented compact model for advanced trench IGBTs without fitting parameters for extreme condition: Part II.
Microelectron. Reliab.
Junpei Takaishi, Syohei Harada, Masanori Tsukuda, Ichiro Omura
2013 J jnl
IGBT chip current imaging system by scanning local magnetic field.
Microelectron. Reliab.
Hiroaki Shiratsuchi, Kohei Matsushita, Ichiro Omura
2013 J jnl
Real time degradation monitoring system for high power IGBT module under power cycling test.
Microelectron. Reliab.
Akihiko Watanabe, Masanori Tsukuda, Ichiro Omura
2012 J jnl
Real-time failure imaging system under power stress for power semiconductors using Scanning Acoustic Tomography (SAT).
Microelectron. Reliab.
Akihiko Watanabe, Ichiro Omura
2011 J jnl
"Design for EMI" approach on power PiN diode reverse recovery.
Microelectron. Reliab.
Masanori Tsukuda, Keiichiro Kawakami, Kenichi Takahama, Ichiro Omura
2011 J jnl
Structure oriented compact model for advanced trench IGBTs without fitting parameters for extreme condition: Part I.
Microelectron. Reliab.
Masahiro Tanaka, Ichiro Omura
2011 J jnl
Tiny-scale "stealth" current sensor to probe power semiconductor device failure.
Microelectron. Reliab.
Yuya Kasho, Hidetoshi Hirai, Masanori Tsukuda, Ichiro Omura
2007 J jnl
Power Semiconductor Devices for Hybrid, Electric, and Fuel Cell Vehicles.
Proc. IEEE
Zheng John Shen, Ichiro Omura