Ian M. Bell

18 papers A 1C 4Journal 9Unranked 4
YearRankTypeTitle / Venue / Authors
2013 J jnl
Survey and Evaluation of Automated Model Generation Techniques for High Level Modeling and High Level Fault Modeling.
J. Electron. Test.
Likun Xia, Muhammad Umer Farooq, Ian M. Bell, Fawnizu Azmadi Hussin, Aamir Saeed Malik
2011 J jnl
Assessment of Microfluidic System Testability using Fault Simulation and Test Metrics.
J. Electron. Test.
Thomas O. Myers, Ian M. Bell
2010 J jnl
Automated Model Generation Algorithm for High-Level Fault Modeling.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Likun Xia, Ian M. Bell, Antony J. Wilkinson
2008 C conf
A novel approach for automated model generation.
ISCAS
Likun Xia, Ian M. Bell, Antony J. Wilkinson
2007 J jnl
Asynchronous arbiter for micro-threaded chip multiprocessors.
J. Syst. Archit.
Nabil Hasasneh, Ian M. Bell, Chris R. Jesshope
2007 C conf
High Level Modelling and Design For a Microthreaded Scheduler to Support Microgrids.
AICCSA
Nabil Hasasneh, Ian M. Bell, Chris R. Jesshope
2007 J jnl
The Effectiveness of Test in Controlling Quality Costs: A Conformability Analysis Based Approach.
J. Electron. Test.
J. M. Gilbert, Ian M. Bell
2006 — conf
Scalable and Partitionable Asynchronous Arbiter for Micro-threaded Chip Multiprocessors.
ARCS
Nabil Hasasneh, Ian M. Bell, Chris R. Jesshope
2006 J jnl
Supporting Microthread Scheduling and Synchronisation in CMPs.
Int. J. Parallel Program.
Ian M. Bell, Nabil Hasasneh, Chris R. Jesshope
2004 J jnl
Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations.
J. Electron. Test.
Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski
2002 — conf
Design, Manufacture and Test - Quality Test Estimation.
ISQED
J. M. Gilbert, Ian M. Bell, D. R. Johnson
1998 — conf
Evaluation and comparison of structural test methodologies for analogue and mixed signal circuits.
ICECS
Ian M. Bell, Stephen J. Spinks
1997 A conf
An On-Line Self-Testing Switched-Current Integrator.
ITC
Osama K. Abu-Shahla, Ian M. Bell
1997 J jnl
Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
S. Yu, Barrie W. Jervis, Kevin R. Eckersall, Ian M. Bell
1997 — conf
Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations.
DFT
Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski
1996 J jnl
Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits.
J. Electron. Test.
José Machado da Silva, José Silva Matos, Ian M. Bell, Gaynor E. Taylor
1995 C conf
Concurrent Self Test of Switched Current Circuits Based on the S
ISCAS
Geir E. Sæther, Chris Toumazou, Gaynor E. Taylor, Kevin R. Eckersall, Ian M. Bell
1995 C conf
Fault Orientated Test and Fault Simulation of Mixed Signal Integrated Circuits.
ISCAS
Ian M. Bell, Kevin R. Eckersall, Stephen J. Spinks, Gaynor E. Taylor