Hyunyul Lim

15 papers A 1C 1Journal 9Unranked 4
YearRankTypeTitle / Venue / Authors
2025 A conf
Advanced fault model, diagnosis and applications for deep nanometer process.
ITC
Youngseok Son, Muyun Cho, Hyunyul Lim, Jaeseok Park, Piotr Zimnowlodzki, Szczepan Urban, Jayant D'Souza, Manish Sharma
2020 J jnl
Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks.
Sensors
Hyunyul Lim, Minho Cheong, Sungho Kang
2019 — conf
A Hardware-efficient TSV Repair Scheme Based on Butterfly Topology.
ISOCC
Minho Cheng, Hyunyul Lim, Tae Hyun Kim, Sungho Kang
2018 C conf
Neural Network Reliability Enhancement Approach Using Dropout Underutilization in GPU.
TENCON
Dongsu Lee, Hyunyul Lim, Tae Hyun Kim, Sungho Kang
2017 J jnl
FRESH: A New Test Result Extraction Scheme for Fast TSV Tests.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jaeseok Park, Hyunyul Lim, Sungho Kang
2017 — conf
LARECD: Low area overhead and reliable error correction DMR architecture.
ISOCC
Hyunyul Lim, Tae Hyun Kim, Dongsu Lee, Sungho Kang
2016 J jnl
A New 3-D Fuse Architecture to Improve Yield of 3-D Memories.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang
2016 J jnl
Optimized Built-In Self-Repair for Multiple Memories.
IEEE Trans. Very Large Scale Integr. Syst.
Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang
2016 — conf
P-backtracking: A new scan chain diagnosis method with probability.
ISOCC
Tae Hyun Kim, Hyunyul Lim, Sungho Kang
2015 J jnl
3-D Stacked DRAM Refresh Management With Guaranteed Data Reliability.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jaeil Lim, Hyunyul Lim, Sungho Kang
2015 J jnl
A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories.
IEEE Trans. Reliab.
Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang
2015 J jnl
Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact of Negative Bias Temperature Instability.
ACM Comput. Surv.
Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang
2015 — conf
Low power scan bypass technique with test data reduction.
ISQED
Hyunyul Lim, Wooheon Kang, Sungyoul Seo, Yong Lee, Sungho Kang
2013 J jnl
Dynamic thermal management for 3D multicore processors under process variations.
IEICE Electron. Express
Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang
2013 J jnl
Thermal-aware dynamic voltage frequency scaling for many-core processors under process variations.
IEICE Electron. Express
Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang