Hyunggoy Oh

17 papers Journal 9Unranked 8
YearRankTypeTitle / Venue / Authors
2021 J jnl
On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug.
IEEE Access
Hayoung Lee, Hyunggoy Oh, Sungho Kang
2019 — conf
A New Scan Chain Reordering Method for Low Power Consumption based on Care Bit Density.
ISOCC
Kyunghwan Cho, Jihye Kim, Hyunggoy Oh, Sangjun Lee, Sungho Kang
2018 — conf
Dynamic voltage Drop induced Path Delay Analysis for STV and NTV Circuits during At-speed Scan Test.
ISOCC
Hyunggoy Oh, Heetae Kim, Sangjun Lee, Sungho Kang
2018 — conf
Low Power Scan Chain Architecture Based on Circuit Topology.
ISOCC
Heetae Kim, Hyunggoy Oh, Sangjun Lee, Sungho Kang
2018 J jnl
Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost.
IEEE Trans. Computers
Inhyuk Choi, Hyunggoy Oh, Young-Woo Lee, Sungho Kang
2018 J jnl
Thermal Aware Test Scheduling for NTV Circuit.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jaeil Lim, Hyunggoy Oh, Heetae Kim, Sungho Kang
2017 J jnl
A novel X-filling method for capture power reduction.
IEICE Electron. Express
Heetae Kim, Hyunggoy Oh, Jaeil Lim, Sungho Kang
2017 — conf
A selective error data capture method using on-chip DRAM for silicon debug of multi-core design.
ISOCC
Hyunggoy Oh, Heetae Kim, Jaeil Lim, Sungho Kang
2017 J jnl
An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time.
IEEE Trans. Computers
Hyunggoy Oh, Taewoo Han, Inhyuk Choi, Sungho Kang
2017 J jnl
DRAM-Based Error Detection Method to Reduce the Post-Silicon Debug Time for Multiple Identical Cores.
IEEE Trans. Computers
Hyunggoy Oh, Inhyuk Choi, Sungho Kang
2017 J jnl
Proof of Concept of Home IoT Connected Vehicles.
Sensors
Younsun Kim, Hyunggoy Oh, Sungho Kang
2017 J jnl
Reconfigurable scan architecture for test power and data volume reduction.
IEICE Electron. Express
Hyunggoy Oh, Heetae Kim, Jaeil Lim, Sungho Kang
2016 — conf
A new online test and debug methodology for automotive camera image processing system.
APCCAS
Hyunggoy Oh, Inhyuk Choi, Sungho Kang
2016 J jnl
Parallelized Network-on-Chip-Reused Test Access Mechanism for Multiple Identical Cores.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang
2016 — conf
Process variation-aware bridge fault analysis.
ISOCC
Heetae Kim, Inhyuk Choi, Jaeil Lim, Hyunggoy Oh, Sungho Kang
2016 — conf
Test access mechaism for stack test time reduction of 3-dimensional integrated circuit.
APCCAS
Inhyuk Choi, Hyunggoy Oh, Sungho Kang
2014 — conf
A Scalable and Parallel Test Access Strategy for NoC-Based Multicore System.
ATS
Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang