Hyeok Yun

12 papers Journal 11Unranked 1
YearRankTypeTitle / Venue / Authors
2025 J jnl
Machine Learning-Driven Extraction of Hybrid Compact Models Integrating Neural Networks and Berkeley Short-Channel Insulated-Gate Field-Effect Transistor Model-Common Multigate for Multidevice Applications.
Adv. Intell. Syst.
Seungjoon Eom, Seunghwan Lee, Hyeok Yun, Kyeongrae Cho, Soomin Kim, Rock-Hyun Baek
2025 — conf
Tracking Economic Disparities in North Korea: Satellite Imagery Analysis Using AI with Policy Insights.
GoodIT
Sumin Lee, Hyoshin Kim, DongHyun Ahn, Donggyu Lee, Jungwon Kim, Hyeok Yun, Chaemin Jang, WoonChul Jung, Dongman Lee, Meeyoung Cha, Jihee Kim
2024 J jnl
Multi-Task Learning for Real-Time BSIM-CMG Parameter Extraction of NSFETs With Multiple Structural Variations.
IEEE Access
Seunghwan Lee, Seungjoon Eom, Jinsu Jeong, Junjong Lee, Sanguk Lee, Hyeok Yun, Yonghwan Ahn, Rock-Hyun Baek
2024 J jnl
Neural Compact Modeling Framework for Flexible Model Parameter Selection with High Accuracy and Fast SPICE Simulation.
Adv. Intell. Syst.
Seungjoon Eom, Hyeok Yun, Hyundong Jang, Kyeongrae Cho, Seunghwan Lee, Jinsu Jeong, Rock-Hyun Baek
2024 J jnl
Nonlinear Variation Decomposition of Neural Networks for Holistic Semiconductor Process Monitoring.
Adv. Intell. Syst.
Hyeok Yun, Hyundong Jang, Seunghwan Lee, Junjong Lee, Kyeongrae Cho, Seungjoon Eom, Soomin Kim, Choong-Ki Kim, Hong-Chul Byun, Seongjoo Han, Min-Soo Yoo, Rock-Hyun Baek
2023 J jnl
Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development.
Adv. Intell. Syst.
Hyeok Yun, Chang-Hyeon An, Hyundong Jang, Kyeongrae Cho, Jeong-Sik Lee, Seungjoon Eom, Choong-Ki Kim, Min-Soo Yoo, Hyun-Chul Choi, Rock-Hyun Baek
2023 J jnl
Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning.
IEEE Access
Kihoon Nam, Chanyang Park, Hyeok Yun, Jun-Sik Yoon, Hyundong Jang, Kyeongrae Cho, Min Sang Park, Hyun-Chul Choi, Rock-Hyun Baek
2023 J jnl
Modeling of 3D NAND Characteristics for Cross-Temperature by Using Graph Neural Network and Its Application.
Adv. Intell. Syst.
Kyeongrae Cho, Jeong-Sik Lee, Chanyang Park, Hyeok Yun, Hyundong Jang, Seungjoon Eom, Min Sang Park, Hyun-Chul Choi, Rock-Hyun Baek
2022 J jnl
Extraction of Device Structural Parameters Through DC/AC Performance Using an MLP Neural Network Algorithm.
IEEE Access
Hyundong Jang, Hyeok Yun, Chanyang Park, Kyeongrae Cho, Kihoon Nam, Jun-Sik Yoon, Hyun-Chul Choi, Rock-Hyun Baek
2021 J jnl
Digital/Analog Performance Optimization of Vertical Nanowire FETs Using Machine Learning.
IEEE Access
Jun-Sik Yoon, Seunghwan Lee, Hyeok Yun, Rock-Hyun Baek
2020 J jnl
Neural Approach for Modeling and Optimizing Si-MOSFET Manufacturing.
IEEE Access
Hyun-Chul Choi, Hyeok Yun, Jun-Sik Yoon, Rock-Hyun Baek
2019 J jnl
Source/Drain Patterning FinFETs as Solution for Physical Area Scaling Toward 5-nm Node.
IEEE Access
Jun-Sik Yoon, Seunghwan Lee, Junjong Lee, Jinsu Jeong, Hyeok Yun, Bohyeon Kang, Rock-Hyun Baek