| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
J. Electron. Test.
|
| 2024 | — | conf |
CCWC
|
| 2024 | — | conf |
SmartNets
|
| 2022 | — | conf |
CCWC
|
| 2010 | — | conf |
CDES
|
| 2010 | J | jnl |
IEEE Instrum. Meas. Mag.
|
| 2010 | — | conf |
CDES
|
| 2009 | — | conf |
CDES
|
| 2009 | — | conf |
CDES
|
| 2008 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2007 | C | conf |
ISCAS
|
| 2007 | — | conf |
CDES
|
| 2006 | — | conf |
MTV
|
| 2006 | — | conf |
CDES
|
| 2005 | — | conf |
CDES
|
| 2005 | — | conf |
Circuits, Signals, and Systems
|
| 2005 | — | conf |
HLDVT
|
| 2005 | — | conf |
CDES
|
| 2005 | — | conf |
MTV
|
| 2004 | — | conf |
ESA/VLSI
|
| 2004 | — | conf |
HLDVT
|
| 2004 | — | conf |
ESA/VLSI
|
| 2003 | — | conf |
VLSI
|
| 2000 | Misc | conf |
VTS
|
| 2000 | J | jnl |
J. Electron. Test.
|
| 1998 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 1998 | — | — |
|
| 1998 | J | jnl |
IEEE Des. Test Comput.
|
| 1998 | J | jnl |
J. Electron. Test.
|
| 1995 | A | conf |
ICCAD
|
| 1994 | C | conf |
ICCD
|
| 1993 | — | conf |
DFT
|
| 1993 | Misc | conf |
VTS
|