| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2022 | J | jnl |
Sensors
|
| 2019 | — | conf |
EIT
|
| 2019 | — | conf |
EIT
|
| 2019 | — | conf |
EIT
|
| 2017 | J | jnl |
J. Intell. Manuf.
|
| 2009 | J | jnl |
Microelectron. Reliab.
|
| 2007 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2001 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2001 | J | jnl |
IEEE Trans. Reliab.
|
| 1998 | B | conf |
SMC
|