| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Trans. Inst. Meas. Control
|
| 2026 | J | jnl |
Pattern Anal. Appl.
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| 2025 | J | jnl |
Trans. Inst. Meas. Control
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| 2025 | J | jnl |
J. Syst. Control. Eng.
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| 2024 | J | jnl |
J. Electronic Imaging
|
| 2023 | J | jnl |
Trans. Inst. Meas. Control
|
| 2022 | J | jnl |
Eng. Appl. Artif. Intell.
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| 2022 | J | jnl |
Int. J. Intell. Transp. Syst. Res.
|
| 2021 | J | jnl |
IET Comput. Vis.
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| 2021 | J | jnl |
Turkish J. Electr. Eng. Comput. Sci.
|
| 2020 | J | jnl |
Neural Comput. Appl.
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
J. Electronic Imaging
|
| 2019 | J | jnl |
J. Quant. Linguistics
|
| 2018 | J | jnl |
IEEE Trans. Veh. Technol.
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| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
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| 2018 | J | jnl |
Int. J. Online Eng.
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| 2018 | J | jnl |
IEEE Access
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| 2016 | J | jnl |
J. Intell. Fuzzy Syst.
|
| 2016 | J | jnl |
IEEE Trans. Ind. Electron.
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| 2016 | J | jnl |
Int. J. Model. Identif. Control.
|
| 2015 | Misc | conf |
ICNC
|
| 2014 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2011 | J | jnl |
J. Softw.
|
| 2006 | — | — |