Huan Xie

24 papers A* 4A 8C 2Journal 10
YearRankTypeTitle / Venue / Authors
2026 J jnl
DeepFlaky: Deep hybrid representation learning for flaky test prediction.
Inf. Softw. Technol.
Jingwen Cai, Yan Lei, Zheyuan Li, Chunyan Liu, Huan Xie, Zhenyu Wu
2026 J jnl
Enhanced Feature Representation via Hybrid Feature Fusion for Coincidental Correctness Detection.
IEEE Trans. Reliab.
Tao Zhang, Yan Lei, Huan Xie, Jian Hu, Chunyan Liu, Jingwen Cai
2026 J jnl
HiFlaky: Hierarchy-aware flakiness classification.
J. Syst. Softw.
Zheyuan Li, Zhenyu Wu, Yan Lei, Huan Xie, Maojin Li, Jian Hu
2026 J jnl
Mutants Will Tell: Statistical Mutation-Based Multiple Fault Localization for Deep Learning Programs.
IEEE Trans. Software Eng.
Huan Xie, Zhengxiong Deng, Yan Lei, Maojin Li, Meng Yan, David Lo
2026 J jnl
Survey on Learning-based Dynamic Fault Localization: From Traditional Machine Learning to Large Language Models.
ACM Comput. Surv.
Chunyan Liu, Yan Lei, Huan Xie, Jinping Wang, Yue Yu, David Lo
2025 C conf
AgentTCP: A Collaborative Multi-Agent Framework for Change-Aware Test Case Prioritization.
APSEC
Junyu Chen, Xiuhua Li, Jinping Wang, Huan Xie, Chunyan Liu, Zhenyu Wu, Yan Lei
2025 A* conf
From Sparse to Structured: A Diffusion-Enhanced and Feature-Aligned Framework for Coincidental Correctness Detection.
ASE
Huan Xie, Chunyan Liu, Yan Lei, Zhenyu Wu, Jinping Wang
2025 A* conf
Sifting Truth from Coincidences: A Two-Stage Positive and Unlabeled Learning Model for Coincidental Correctness Detection.
ASE
Chunyan Liu, Huan Xie, Yan Lei, Zhenyu Wu, Jinping Wang
2024 A* conf
Combining Coverage and Expert Features with Semantic Representation for Coincidental Correctness Detection.
ASE
Huan Xie, Yan Lei, Maojin Li, Meng Yan, Sheng Zhang
2024 J jnl
Demystifying API misuses in deep learning applications.
Empir. Softw. Eng.
Deheng Yang, Kui Liu, Yan Lei, Li Li, Huan Xie, Chunyan Liu, Zhenyu Wang, Xiaoguang Mao, Tegawendé F. Bissyandé
2024 A conf
Flakyrank: Predicting Flaky Tests Using Augmented Learning to Rank.
SANER
Jiaguo Wang, Yan Lei, Maojin Li, Guanyu Ren, Huan Xie, Shifeng Jin, Junchao Li, Jian Hu
2024 A conf
Labelrepair: Sequence Labelling for Compilation Errors Repair.
SANER
Zhenyu Wu, Deheng Yang, Yan Lei, Huan Xie, Minghua Tang, Maojin Li
2024 J jnl
Towards More Precise Coincidental Correctness Detection With Deep Semantic Learning.
IEEE Trans. Software Eng.
Huan Xie, Yan Lei, Meng Yan, Shanshan Li, Xiaoguang Mao, Yue Yu, David Lo
2023 J jnl
A light-weight data augmentation method for fault localization.
Inf. Softw. Technol.
Jian Hu, Huan Xie, Yan Lei, Ke Yu
2023 A conf
Contrastive Coincidental Correctness Representation Learning.
ISSRE
Maojin Li, Yan Lei, Huan Xie, Jiaguo Wang, Chunyan Liu, Zhengxiong Deng
2023 A conf
Mitigating the Effect of Class Imbalance in Fault Localization Using Context-aware Generative Adversarial Network.
ICPC
Yan Lei, Tiantian Wen, Huan Xie, Lingfeng Fu, Chunyan Liu, Lei Xu, Hongxia Sun
2023 J jnl
Mitigating the Effect of Class Imbalance in Fault Localization Using Context-aware Generative Adversarial Network.
CoRR
Yan Lei, Tiantian Wen, Huan Xie, Lingfeng Fu, Chunyan Liu, Lei Xu, Hongxia Sun
2023 A conf
NeuralCCD: Integrating Multiple Features for Neural Coincidental Correctness Detection.
SANER
Zhou Tao, Yan Lei, Huan Xie, Jian Hu
2023 C conf
On the Reliability of Coverage Data for Fault Localization.
APSEC
Huan Xie, Maojin Li, Yan Lei, Jian Hu, Shanshan Li, Xiaoguang Mao, Yue Yu
2022 A* conf
A Universal Data Augmentation Approach for Fault Localization.
ICSE
Huan Xie, Yan Lei, Meng Yan, Yue Yu, Xin Xia, Xiaoguang Mao
2022 A conf
BCL-FL: A Data Augmentation Approach with Between-Class Learning for Fault Localization.
SANER
Yan Lei, Chunyan Liu, Huan Xie, Sheng Huang, Meng Yan, Zhou Xu
2022 A conf
Context-based cluster fault localization.
ICPC
Junji Yu, Yan Lei, Huan Xie, Lingfeng Fu, Chunyan Liu
2022 J jnl
Feature-FL: Feature-Based Fault Localization.
IEEE Trans. Reliab.
Yan Lei, Huan Xie, Tao Zhang, Meng Yan, Zhou Xu, Chengnian Sun
2021 A conf
Is the Ground Truth Really Accurate? Dataset Purification for Automated Program Repair.
SANER
Deheng Yang, Yan Lei, Xiaoguang Mao, David Lo, Huan Xie, Meng Yan