| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
IEEE Internet Things J.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
CoRR
|
| 2022 | J | jnl |
Remote. Sens.
|
| 2022 | C | conf |
ICIS
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
CoRR
|
| 2022 | C | conf |
IECON
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
Remote. Sens.
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
Proc. IEEE
|
| 2020 | J | jnl |
Sensors
|
| 2020 | J | jnl |
IEEE Intell. Syst.
|
| 2019 | C | conf |
IECON
|
| 2019 | — | conf |
ICIT
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Internet Things J.
|
| 2019 | C | conf |
IECON
|
| 2019 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | C | conf |
IECON
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Lifetime prediction of aluminum electrolytic capacitors in LED drivers considering parameter shifts.
Microelectron. Reliab.
|
| 2018 | C | conf |
IAS
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2017 | — | conf |
ISIE
|
| 2017 | C | conf |
IECON
|
| 2017 | C | conf |
IECON
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | C | conf |
IECON
|
| 2017 | C | conf |
IECON
|
| 2017 | — | conf |
ISIE
|
| 2017 | C | conf |
IECON
|
| 2016 | C | conf |
IECON
|
| 2016 | C | conf |
IECON
|
| 2016 | C | conf |
IECON
|
| 2016 | J | jnl |
J. Circuits Syst. Comput.
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | C | conf |
IECON
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | C | conf |
IECON
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2014 | J | jnl |
ACM Trans. Auton. Adapt. Syst.
|
| 2014 | C | conf |
IECON
|
| 2013 | — | conf |
FSKD
|
| 2013 | C | conf |
IECON
|
| 2013 | C | conf |
IECON
|
| 2013 | — | — |
|
| 2013 | C | conf |
IECON
|
| 2013 | J | jnl |
Microelectron. Reliab.
|
| 2013 | C | conf |
IAS
|
| 2012 | C | conf |
IECON
|
| 2011 | — | conf |
FSKD
|
| 2010 | — | conf |
QSIC
|
| 2009 | A* | conf |
ASE
|
| 2005 | A | conf |
IPDPS
|
| 2005 | A | conf |
ICS
|