Hsuan-Ling Kao

16 papers C 4Journal 11Unranked 1
YearRankTypeTitle / Venue / Authors
2017 J jnl
A high output power and low phase noise GaN HEMT VCO with array of switchable inductors.
Int. J. Circuit Theory Appl.
Hsuan-Ling Kao, Chih-Sheng Yeh, Hsien-Chin Chiu, Cheng-Lin Cho, Chun-Hu Cheng
2017 J jnl
Effect of body bias and temperature on low-frequency noise in 40-nm nMOSFETs.
Microelectron. Reliab.
Hsien-Chin Chiu, Min-Li Chou, Chun-Hu Cheng, Hsuan-Ling Kao, Cheng-Lin Cho
2016 J jnl
The ESD protection characteristic and low-frequency noise analysis of GaN Schottky barrier diode with fluorine-based plasma treatment.
Microelectron. Reliab.
Hsien-Chin Chiu, Ji-Fan Chi, Hsuan-Ling Kao, Chia-Yi Chu, Kuan-Liang Cho, Feng-Tso Chien
2013 C conf
Design of an S-band 0.35 µm AlGaN/GaN LNA using cascode topology.
DDECS
Hsuan-Ling Kao, Chih-Sheng Yeh, Cheng-Lin Cho, B. W. Wang, P. C. Lee, B. H. Wei, Hsien-Chin Chiu
2013 J jnl
Low frequency noise in field-plate multigate AlGaN/GaN single-pole-single-throw RF switches on silicon substrate.
Microelectron. Reliab.
Hsien-Chin Chiu, Chao-Wei Lin, Fan-Hsiu Huang, Hsuan-Ling Kao, Feng-Tso Chien, Hao-Wei Chuang, Kuo-Jen Chang, Yau-Tang Gau
2013 J jnl
Low gate interface traps AlGaN/GaN HEMTs using a lattice matched ZrZnO transparent gate design.
Microelectron. Reliab.
Hsien-Chin Chiu, Hsiang-Chun Wang, Chao-Wei Lin, Yi-Cheng Luo, Hsuan-Ling Kao, Feng-Tso Chien, Ping-Kuo Weng, Yan-Tang Gau, Hao-Wei Chuang
2013 J jnl
Sidewall defects of AlGaN/GaN HEMTs evaluated by low frequency noise analysis.
Microelectron. Reliab.
Hsien-Chin Chiu, Chao-Hung Chen, Hsuan-Ling Kao, Feng-Tso Chien, Ping-Kuo Weng, Yan-Tang Gau, Hao-Wei Chuang
2012 J jnl
A gold-free fully copper metalized AlGaN/GaN power HEMTs on Si substrate.
Microelectron. Reliab.
Hsien-Chin Chiu, Chao-Wei Lin, Hsuan-Ling Kao, Geng-Yen Lee, Jen-Inn Chyi, Hao-Wei Chuang, Kuo-Jen Chang, Yau-Tang Gau
2012 C conf
A low phase noise Ka-band voltage controlled oscillator using 0.15 µm GaAs pHEMT technology.
DDECS
Hsuan-Ling Kao, S. P. Shih, Chih-Sheng Yeh, Li-Chun Chang
2012 J jnl
Characterization and reliability of nMOSFETs on flexible substrates under mechanical strain.
Microelectron. Reliab.
Hsuan-Ling Kao, Chih-Sheng Yeh, Meng-Ting Chen, Hsien-Chin Chiu, Li-Chun Chang
2012 J jnl
Investigation on the thermal behavior of 0.15 μm gate-length In
Microelectron. Reliab.
Che-Kai Lin, Hsien-Chin Chiu, Chao-Wei Lin, Hsuan-Ling Kao, Feng-Tso Chien
2011 — conf
A Ka-band triple push coupled pair VCO using 0.18-μm CMOS technology.
WOCN
Hsuan-Ling Kao, S. P. Shih, Chih-Sheng Yeh, Chia-Ming Yang, C. Y. Ke, Y. C. Lee, Jeffrey S. Fu, Li-Chun Chang
2011 J jnl
A fully on-chip ESD protection UWB-band low noise amplifier using GaAs enhancement-mode dual-gate pHEMT technology.
Microelectron. Reliab.
Hsien-Chin Chiu, Chia-Shih Cheng, Hsuan-Ling Kao, Jeffrey S. Fu, Qiang Cui, Juin J. Liou
2011 J jnl
Thermal stability investigations of AlGaN/GaN HEMTs with various high work function gate metal designs.
Microelectron. Reliab.
Hsien-Chin Chiu, Chao-Wei Lin, Che-Kai Lin, Hsuan-Ling Kao, Jeffrey S. Fu
2010 C conf
A low phase noise 20 GHz voltage control oscillator using 0.18-μm CMOS technology.
DDECS
Chia-Ming Yang, Hsuan-Ling Kao, Y. C. Chang, M. T. Chen, H. M. Chang, C. H. Wu
2009 C conf
0.18 µm CMOS UWB LNA with new feedback configuration for optimization low noise, high gain and small area.
DDECS
Y. C. Chang, Hsuan-Ling Kao, C. H. Kao, C. H. Yang, Jeffrey S. Fu, Nemai C. Karmakar, Li-Chun Chang