Horst Lewitschnig

13 papers Misc 2Journal 9Unranked 2
YearRankTypeTitle / Venue / Authors
2025 J jnl
A data-driven modelling framework for predicting the quality of semiconductor devices to support burn-in decisions.
Comput. Ind. Eng.
Ibrahim Ahmed, Piero Baraldi, Enrico Zio, Horst Lewitschnig
2023 — conf
A Data-driven Condition Monitoring method to predict the Remaining Useful Life of SiC Power Modules for Traction Inverters.
ICPHM
Giovanni Di Nuzzo, Horst Lewitschnig, Marc Tüllmann, Sven Rzepka, Alexander Otto
2021 J jnl
Flexible time reduction method for burn-in of high-quality products.
Qual. Reliab. Eng. Int.
Daniel Kurz, Horst Lewitschnig, Jürgen Pilz
2021 Misc conf
Monitoring Hierarchical Systems for Safety Assurance.
IDC
Franz Wotawa, Horst Lewitschnig
2020 — conf
Weakness Monitors for Fail-Aware Systems.
FORMATS
Wolfgang Granig, Stefan Jaksic, Horst Lewitschnig, Cristinel Mateis, Dejan Nickovic
2019 J jnl
Fractional Failures Sampling - An Alternative to Zero Failures Sampling Plans.
IEEE Trans. Reliab.
Horst Lewitschnig, Armin Fanzott
2017 J jnl
Determination of tolerance limits for the reliability of semiconductor devices using longitudinal data.
Qual. Reliab. Eng. Int.
Vera Hofer, Johannes Leitner, Horst Lewitschnig, Thomas Nowak
2015 J jnl
Advances on the Stress Interaction Model.
IEEE Trans. Reliab.
Horst Lewitschnig
2015 J jnl
An advanced area scaling approach for semiconductor burn-in.
Microelectron. Reliab.
Daniel Kurz, Horst Lewitschnig, Jürgen Pilz
2014 J jnl
Advanced Bayesian Estimation of Weibull Early Life Failure Distributions.
Qual. Reliab. Eng. Int.
Daniel Kurz, Horst Lewitschnig, Jürgen Pilz
2014 J jnl
Decision-Theoretical Model for Failures Which are Tackled by Countermeasures.
IEEE Trans. Reliab.
Daniel Kurz, Horst Lewitschnig, Jürgen Pilz
2014 Misc conf
Survey of recent advanced statistical models for early life failure probability assessment in semiconductor manufacturing.
WSC
Daniel Kurz, Horst Lewitschnig, Jürgen Pilz
2011 J jnl
Quality assurance in automotive electronics.
Elektrotech. Informationstechnik
Verena Müller, Horst Lewitschnig, Nicoleta Kortik, Werner Kanert