| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Comput. Ind. Eng.
|
| 2023 | — | conf |
ICPHM
|
| 2021 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2021 | Misc | conf |
IDC
|
| 2020 | — | conf |
FORMATS
|
| 2019 | J | jnl |
IEEE Trans. Reliab.
|
| 2017 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2015 | J | jnl |
IEEE Trans. Reliab.
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2014 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2014 | J | jnl |
IEEE Trans. Reliab.
|
| 2014 | Misc | conf |
WSC
|
| 2011 | J | jnl |
Elektrotech. Informationstechnik
|