| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | — | conf |
CNML
|
| 2023 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
J. Electr. Comput. Eng.
|
| 2022 | J | jnl |
J. Electr. Comput. Eng.
|
| 2022 | J | jnl |
J. Electronic Imaging
|
| 2021 | — | conf |
CONF-CDS
|
| 2021 | J | jnl |
Multim. Tools Appl.
|
| 2021 | J | jnl |
J. Electr. Comput. Eng.
|
| 2021 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2018 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2014 | J | jnl |
Microelectron. Reliab.
|