| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Intelligent support-free additive manufacturing path planning via method library and neural network.
Robotics Comput. Integr. Manuf.
|
| 2024 | J | jnl |
IEEE Access
|
| 2023 | — | conf |
ICIRA (6)
|
| 2022 | J | jnl |
Expert Syst. Appl.
|
| 2021 | J | jnl |
Automated detection of defects with low semantic information in X-ray images based on deep learning.
J. Intell. Manuf.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | J | jnl |
J. Syst. Control. Eng.
|
| 2018 | J | jnl |
Sensors
|
| 2017 | J | jnl |
Int. J. Comput. Integr. Manuf.
|
| 2016 | J | jnl |
Int. J. Comput. Integr. Manuf.
|
| 2015 | J | jnl |
Int. J. Comput. Integr. Manuf.
|
| 2015 | J | jnl |
Comput. Aided Des.
|
| 2014 | J | jnl |
Comput. Aided Des.
|
| 2014 | J | jnl |
Comput. Aided Des.
|
| 2011 | J | jnl |
Int. J. Comput. Integr. Manuf.
|