| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Pattern Recognit.
|
| 2026 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
Sci. China Inf. Sci.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | — | conf |
CSCW Companion
|
| 2025 | J | jnl |
J. Electronic Imaging
|
| 2025 | — | conf |
GROUP Companion
|
| 2025 | J | jnl |
Int. J. Comput. Vis.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2024 | A* | conf |
ACM Multimedia
|
| 2024 | J | jnl |
IEEE Trans. Image Process.
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Access
|
| 2023 | J | jnl |
Comput. Phys. Commun.
|
| 2023 | J | jnl |
IEEE Trans. Intell. Transp. Syst.
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
Proc. ACM Hum. Comput. Interact.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | A* | conf |
ICCV
|
| 2023 | J | jnl |
J. Open Source Softw.
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | B | conf |
IJCNN
|
| 2021 | — | conf |
ICIG (3)
|
| 2021 | J | jnl |
Graph. Model.
|
| 2021 | A | conf |
ICME
|
| 2020 | J | jnl |
J. Parallel Distributed Comput.
|
| 2020 | J | jnl |
High-Resolution Temperature Distribution Measurement of GIL Spacer Based on OFDR and Ultraweak FBGs.
IEEE Trans. Instrum. Meas.
|
| 2016 | J | jnl |
Sensors
|