| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
CoRR
|
| 2026 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2024 | — | conf |
ICAAI
|
| 2024 | J | jnl |
Microelectron. J.
|
| 2024 | J | jnl |
SIAM J. Imaging Sci.
|
| 2024 | J | jnl |
SIAM J. Numer. Anal.
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
Comput. Methods Appl. Math.
|
| 2023 | J | jnl |
Symmetry
|
| 2023 | J | jnl |
SIAM J. Imaging Sci.
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
Microelectron. J.
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | — | conf |
CyberC
|
| 2023 | J | jnl |
CoRR
|
| 2022 | — | conf |
CyberC
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
J. Glob. Inf. Manag.
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
J. Chem. Inf. Model.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Modeling the impact of well contacts on SEE response with bias-dependent Single-Event compact model.
Microelectron. Reliab.
|
| 2017 | J | jnl |
Heavy ion micro-beam study of single-event transient (SET) in SiGe heterjunction bipolar transistor.
Sci. China Inf. Sci.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2012 | J | jnl |
Sci. China Inf. Sci.
|
| 2012 | J | jnl |
J. Comput. Chem.
|
| 2006 | C | conf |
ICARCV
|
| 2005 | J | jnl |
Appl. Math. Lett.
|