Hongxia Fang

12 papers B 1Misc 1Journal 5Unranked 4
YearRankTypeTitle / Venue / Authors
2012 J jnl
Diagnosis of Board-Level Functional Failures Under Uncertainty Using Dempster-Shafer Theory.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Hongxia Fang, Krishnendu Chakrabarty, Zhiyuan Wang, Xinli Gu
2012 J jnl
Functional Test-Sequence Grading at Register-Transfer Level.
IEEE Trans. Very Large Scale Integr. Syst.
Hongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti
2012 J jnl
Reproduction and Detection of Board-Level Functional Failure.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Hongxia Fang, Krishnendu Chakrabarty, Zhiyuan Wang, Xinli Gu
2011 — —
Design-for-Testability and Diagnosis Methods to target unmodeled Defects in Integrated Circuits and Multi-Chip Boards.
Hongxia Fang
2011 — conf
Deterministic test for the reproduction and detection of board-level functional failures.
ASP-DAC
Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty
2011 B conf
Ranking of Suspect Faulty Blocks Using Dataflow Analysis and Dempster-Shafer Theory for the Diagnosis of Board-Level Functional Failures.
ETS
Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty
2010 — conf
Mimicking of Functional State Space with Structural Tests for the Diagnosis of Board-Level Functional Failures.
Asian Test Symposium
Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty
2010 J jnl
RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences.
J. Electron. Test.
Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwara
2009 — conf
Bit-Operation-Based Seed Augmentation for LFSR Reseeding with High Defect Coverage.
Asian Test Symposium
Hongxia Fang, Krishnendu Chakrabarty, Rubin A. Parekhji
2009 J jnl
Deviation-Based LFSR Reseeding for Test-Data Compression.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Zhanglei Wang, Hongxia Fang, Krishnendu Chakrabarty, Michael Bienek
2009 Misc conf
RT-Level Deviation-Based Grading of Functional Test Sequences.
VTS
Hongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti
2009 — conf
RTL DFT techniques to enhance defect coverage for functional test sequences.
HLDVT
Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwara