| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Sci. China Inf. Sci.
|
| 2026 | J | jnl |
Appl. Soft Comput.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | — | conf |
IEEE SENSORS
|
| 2023 | J | jnl |
Bias Accuracy Maintenance Under Unknown Disturbances by Multiple Homogeneous MEMS Gyroscopes Fusion.
IEEE Trans. Ind. Electron.
|
| 2023 | — | conf |
SENSORS
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
Sci. China Inf. Sci.
|
| 2022 | J | jnl |
Sci. China Inf. Sci.
|
| 2021 | — | conf |
NEMS
|
| 2021 | J | jnl |
Sci. China Inf. Sci.
|
| 2021 | — | conf |
NEMS
|
| 2019 | C | conf |
IECON
|
| 2018 | — | conf |
IEEE SENSORS
|
| 2018 | — | conf |
AIM
|
| 2017 | — | conf |
IEEE SENSORS
|
| 2017 | — | conf |
NEMS
|
| 2017 | — | conf |
IEEE SENSORS
|
| 2016 | — | conf |
IEEE SENSORS
|
| 2016 | J | jnl |
Sensors
|
| 2016 | — | conf |
NEMS
|
| 2015 | J | jnl |
Sensors
|
| 2015 | — | conf |
NEMS
|
| 2015 | J | jnl |
Sensors
|
| 2014 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2014 | — | conf |
NEMS
|
| 2012 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2012 | J | jnl |
Sensors
|
| 2011 | — | conf |
NEMS
|
| 2010 | J | jnl |
Sensors
|
| 2010 | J | jnl |
Sensors
|
| 2009 | — | conf |
NEMS
|
| 2009 | — | conf |
NEMS
|
| 2009 | — | conf |
NEMS
|
| 2009 | — | conf |
NEMS
|
| 2008 | J | jnl |
CoRR
|