| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Inf. Process. Manag.
|
| 2026 | J | jnl |
Adv. Eng. Informatics
|
| 2026 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2026 | J | jnl |
IEEE Trans. Reliab.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Aerosp. Electron. Syst.
|
| 2025 | J | jnl |
Adv. Eng. Informatics
|
| 2025 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2025 | J | jnl |
Biomed. Signal Process. Control.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2024 | J | jnl |
Appl. Soft Comput.
|
| 2024 | J | jnl |
Comput. Secur.
|
| 2024 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2023 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2023 | J | jnl |
Sensors
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
J. Electronic Imaging
|
| 2019 | J | jnl |
Frontiers Comput. Sci.
|
| 2018 | J | jnl |
J. Comput. Sci.
|
| 2018 | J | jnl |
IEEE Signal Process. Lett.
|
| 2018 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | J | jnl |
J. Electronic Imaging
|
| 2016 | J | jnl |
J. Electr. Comput. Eng.
|